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Dimension AFP

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Get the highest performance device characterization and etch depth metrology available with the Dimension Atomic Force Profiler.

It is the world's only AFM single-tool fab solution designed for chemical mechanical planarization and etch metrology at 65 nm.

Specifications

Application Metallurgical; Semiconductor
Grade Research
Microscope Type Scanning Probe / Atomic Force; Atomic Force Profiler (AFP)
Features Digital Display
User Interface  
Remote Interface  


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