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Dimension 5000 SPM

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For semiconductor, data storage device and optics manufacturers the Dimension 5000 provides the perfect tool for highly reliable, automated surface metrology and imaging. This SPM is capable of measuring up to one hundred areas on samples up to 350mm in diameter.

Specifications

Application	Biological / Life Sciences; Gemological; Measuring / Toolmaker / Inspection; Semiconductor
Grade	Benchtop; Research
Microscope Type	Scanning Probe / Atomic Force
Performance Specs
Depth of Field	0.0060 to ? mm

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Dimension 5000 SPM

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