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Get the high-performance, state-of-the-art SPM features you need in the world’s highest resolution SPM with the MultiMode V Scanning Probe Microscope. Representing the next generation of the world's best-selling, most field-proven SPM, the MultiMode V SPM performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields.