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Solids X-ray Fluorescence Spectrometers Datasheets
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Other X-ray Fluorescence Spectrometers
Analyzer Type: »
Computer Interface Options: » Detector Type: » Detector Window: » Display Options: » Excitation Source: » Local Interface: » Measurement Mode: » Module Type: » Optical System: » Sample Type: » |
 
FISCHERSCOPE® -- X-RAY Conti 4000
from Fischer Technology, Inc. / Coating Thickness Gages Measurement of continuously rolling material strips Hardware Features The FISCHERSCOPE® X-RAY Conti 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed...[See More]
Similar parts from Fischer Technology, Inc. / Coating Thickness Gages
FISCHERSCOPE® -- X-RAY XAN-DPP 
Coating Gauge -- CMI900
from Oxford Instruments / Industrial Analysis CMI900 is a cost effective, high performanceXRF analyser for measurement of coating thickness and material composition.[See More]
Similar parts from Oxford Instruments / Industrial Analysis
Coating Thickness Analyzer -- X-Strata980 
EDX-720
from Shimadzu Scientific Instruments, Inc. A non-destructive technique requiring no sample preparation, Energy Dispersive X-ray Fluorescence (EDX) spectrometry can be used either for compliance with various regulations (e.g. RoHS and ELV) and/or for quantitative analysis and monitoring processes in such application areas as chemicals,...[See More]
Similar parts from Shimadzu Scientific Instruments, Inc.
Mirco EDX (uEDX) |
