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Serial Interface X-ray Fluorescence Spectrometers Datasheets


FISCHERSCOPE® -- X-RAY XDAL®
from Fischer Technology, Inc. / Coating Thickness Gages

The FISCHERSCOPE® X-RAY XDAL is an X-Ray spectrometer for quantitative materials analysis.[See More]

  • Module Type: Energy Dispersive 
  • Optical System: Primary NI & Al Filters Optional 
  • ICP Measurement Mode: Sequential 
  • Excitation Source: X-Ray Tubes 
View Datasheet
XRF Analyzer, Handheld -- X-MET 5000
from Oxford Instruments / Industrial Analysis

Engineered for high performance and reliability, this hand-heldXRF analyser combines Oxford Instruments' patented PentaPIN® detector technology offering guaranteed fast analysis and lower limits of detectionfor all elements of interest.[See More]

  • Detector Type: PentaPIN® 
  • Sample Type: Solids 
  • Analyzer Type: Single Channel 
  • User Interface: Digital Front Panel 
View Datasheet