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Other X-ray Fluorescence Spectrometers
Analyzer Type: »
Computer Interface Options: » Detector Type: » Detector Window: » Display Options: » Excitation Source: » Local Interface: » Measurement Mode: » Module Type: » Optical System: » Sample Type: » |
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FISCHERSCOPE® -- X-RAY Conti 4000
from Fischer Technology, Inc. / Coating Thickness Gages Measurement of continuously rolling material strips Hardware Features The FISCHERSCOPE® X-RAY Conti 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed...[See More]
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FISCHERSCOPE® -- X-RAY XAN® , FISCHERSCOPE® -- X-RAY XAN-DPP , FISCHERSCOPE® -- X-RAY XDAL® ,
Coating Gauge -- CMI900
from Oxford Instruments / Industrial Analysis CMI900 is a cost effective, high performanceXRF analyser for measurement of coating thickness and material composition.[See More]
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EDXRF Analyzer -- EX-3600
from Xenemetrix Inc. (Formerly Jordan Valley AR Inc.) Designed especially for difficult sample matrices, the EX-3600M gives customers a choice of advanced powerful options to optimize the instrument for your particular application. The result is a custom-built, high performance instrument, at a price less than that of a larger laboratory unit. The...[See More]
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EDXRF Analyzer -- EX-3600M , EDXRF Analyzer -- EX-6600 , EDXRF Analyzer -- Ex-Calibur , |