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Fischer Technology, Inc. / Coating Thickness Gages Data Sheets for X-ray Fluorescence Spectrometers

Fischer Technology, Inc. / Coating Thickness Gages
Address: 750 Marshall Phelps Rd.
Windsor, CT 06095
 Contact: Web site
E-mail

Phone:  (860) 683-0781
(800) 243-8417
Fax: (860) 688-8496

X-ray Fluorescence Spectrometers:

X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. 

X-ray Fluorescence Spectrometers: Learn more

Product Name
Notes
FISCHERSCOPE® -- X-RAY XUL(M)® Bottom to top measurement direction, good for measuring small components
FISCHERSCOPE® -- X-RAY XAN-DPP Broad range of detectable elements from aluminum to uranium
FISCHERSCOPE® -- X-RAY XDL® - B DCM method corrects the intensity differences of fluorescence spectra
FISCHERSCOPE® -- X-RAY XDVM® - u Dependable system for measurement and analysis of microstructure coatings
FISCHERSCOPE® -- X-RAY Conti 5000 For continuous coating thickness measurements and analyses
FISCHERSCOPE® -- X-RAY XAN® High performance x-ray fluorescence spectrometer for element identification
FISCHERSCOPE® -- X-RAY XDAL® High precision XYZ measuring stage, reliable results
FISCHERSCOPE® -- X-RAY XDLM® - C4 Ideal instrument for testing of mass production items
FISCHERSCOPE® -- X-RAY XDVM® -P Large slotted measurement chamber to assure easy loading
FISCHERSCOPE® -- X-RAY Conti 4000 Measures continuously rolling material strips in a contact-free way
FISCHERSCOPE® -- X-RAY XDV® -SD Specially developed for the challenging tasks of RoHS/ WEEE analyses
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  • Company Description:
    Coating thickness measurement requirements come in a variety of geometric shapes and applications. Not all parts are flat and not all applications are as simple as paint over steel. Fischer Technology has been the leading innovator of Coating Thickness Measurement, Material Testing, and Material... (more)