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Caliber SPM

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Caliber AFM

  • 3-axis high accuracy with closed-loop and sensored-Z piezo scanners
  • Compact easy to handle microscope head adaptable to most environments
  • Scanning tip design provides unlimited sample size capability
  • Extensive control & analysis software allows simultaneous scanning and analysis
  • Capability to easily expand for Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) and Nanolithography capabilities

Specifications

Application Biological / Life Sciences; Gemological; Metallurgical; Semiconductor
Grade Research; Small Video Microscope
Microscope Type Scanning Electron Microscope; Scanning Probe / Atomic Force
Performance Specs
Depth of Field 0.0120 to ? mm
Eyepiece Style  
User Interface  
Remote Interface  


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