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Dimension Vx210/310 AFP

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The Dimension Vx210/310 Atomic Force Profiler (AFP) gives fab operators a unique combination of AFM resolution, long scan capability (up to 100 mm) and high vertical and lateral resolution measurements required for sub-0.25 micron features.

Specifications

Application Metallurgical; Semiconductor
Grade Research
Microscope Type Atomic Force Profiler (AFP)
Eyepiece Style None
Features  
User Interface  
Remote Interface  


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