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Dimension Vx200/300 AFP
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The Dimension Vx200/300 Atomic Force Profiler (AFP) packages AFM-quality resolution with a profiler’s long scan capability of a profiler – and offers the highest performance profiling and atomic force microscopy available. That includes non-destructive profiling and high aspect ratio depth measurements.
This easy-to-use, semi-automated platform offers enhanced flexibility: It can be configured to handle a wide variety of samples in many applications.
Specifications
| Application | Metallurgical; Semiconductor |
| Grade | Research |
| Microscope Type | Atomic Force Profiler (AFP) |
| Eyepiece Style | None |
| Features | |
| User Interface | |
| Remote Interface |
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