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Dimension V SPM

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Incorporating the proven Dimension SPM platform and the industry-leading power of the NanoScope V controller, the Dimension V Scanning Probe Microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter.

Specifications

Application Biological / Life Sciences; Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Probe / Atomic Force
Performance Specs
Depth of Field 0.0060 to ? mm
Eyepiece Style  
Features  
User Interface  
Remote Interface  


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