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EnviroScope AFM

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The EnviroScope atomic force microscope combines modular environmental controls, a sealed hermetic sample chamber, and a wide range of imaging modes to bring superior application flexibility to research and industrial metrology applications.

Specifications

Application	Biological / Life Sciences; Gemological; Metallurgical; Semiconductor
Grade	Benchtop; Research
Microscope Type	Scanning Probe / Atomic Force
Performance Specs
Field of View	6.00 to ? mm

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Depth of Field
Eyepiece Style
User Interface
Remote Interface

EnviroScope AFM

Specifications

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