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Dimension X

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Dimension™ X automated atomic force microscope replaces costly, destructive cross-sectioning techniques, cutting etch measurement time from days to minutes, to help you increase yield without sacrificing quality.

The Dimension X is engineered to provide unequaled throughput of 25 WPH (five sites) and provides in-line repeatable metrology for the most difficult to measure etch features.

Specifications

Application Metallurgical
Grade Research
Microscope Type Scanning Probe / Atomic Force
Eyepiece Style None
Features  
User Interface  
Remote Interface  


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