| Product Name |
Notes |
|
PicoForce
|
Accuracy & flexibility for molecular biology & nanoscale materials research
|
|
Wyko NT1100,
Wyko NT9100 Optical Profiler
|
Accurate surface topography, includes Wyko Vision® analysis software
|
|
Wyko SP9900
|
Automated, non-contact 3D inspection, faster data acquisition, large stage
|
|
EnviroScope AFM
|
Can add vacuum,gas, liquid,&heating to observe sample environmental changes
|
|
Dimension 5000 SPM
|
Capable of measuring up to 100 areas on samples up to 350mm in diameter
|
|
Wyko DMEMS NT1100
|
Characterize micro-devices in 3D as they actuate
|
|
Wyko NT9800
|
Constantly self-calibrating scanner for highest accuracy, optimal stability
|
|
Mulit Mode Closed-Loop Scanner
|
Easy zoom, point and shoot force curve and volume measurements
|
|
InSight 3DAFM
|
Fully automated AFM system, provides fastest throughput of any AFM today
|
|
Dimension AFP
|
Fully automated AFP, perfect for many FEOL and BEOL applications
|
|
Wyko NT9300
|
Fully programmable, automated XY stage, sub-nanometer resolution
|
|
Dimension Vx210/310 AFP
|
Has AFM resolution, long scan capability,high vertical & lateral resolution
|
|
Innova SPM
|
High resolution closed-loop system; fas, easy tip and sample exchange
|
|
Scanning Probe Microscope Head
|
High resolution imaging, high fidelity zoom and offset, precisely localized
|
|
Caliber SPM
|
Ideal entry level instrument for research or industrial labs
|
|
Electrochemical SPM Scanning Probe Scope
|
Includes ECSTM, ECAFM, SECPM, int-situ imaging with nano-scale resolution
|
|
Dimension 3100
|
Low noise performance, images small and large specimens in liquid or air
|
|
MultiMode V
|
Modular design/environmental control, uses AFM and STM techniques
|
|
Wyko DMEMS NT3300
|
Non-contact DMEMS option gives automated 3D measurement of micro-devices
|
|
Wyko HD8100
|
Non-contact identifying of magnetic thin film heads inc PTR & ABS flatness
|
|
Dimension Vx200/300 AFP
|
Offers non-destructive profiling for CMP control, semi-automated platform
|
|
Dimension Icon Atomic Force Microscope
|
One platform, low noise, low drift, immediate research-quality results
|
|
BioScope II Atomic Force Microscope
|
Open optical and physical access,easy access and manipulation of tip/sample
|
|
Dimension X3D for Data Storage
|
Provides 3D metrology for 3D PMR structures and trenches, non-destructive
|
|
BioScope SZ Atomic Force Microscope
|
Provides 10^2 magnification beyond standard optical microscopy
|
|
Wyko SP3250
|
Provides dual-mode 3D measurement of bumps or panels for defect inspection
|
|
Wyko SP3050
|
Provides fast, non-contact, 3D inspection of large panels
|
|
Dimension X
|
Reduces etch measurement turnaround from days to mins, non-destructive
|
|
Wyko Optical Metrology Module
|
Stand-alone module, non-contact, gauge-capable metrology
|
|
Dimension V SPM
|
State of the art closed-loop XYZ scanner, modular design for broad app. set
|
|
Dimension X3D Photomask
|
Superior repeatability, high resolution, non-destructive
|
|
NanoMan VS
|
Unmatched scanning performance, advanced software capabilities
|
|
MultiMode
|
World's best selling SPM, easily gets data on micro- to atomic-scale images
|
