JEOL USA, Inc. Microscopes, All Types Data Sheets on GlobalSpec

JEOL USA, Inc. Data Sheets for Microscopes, All Types

Address:

11 Dearborn Rd.
Peabody, MA 01960

Contact:

Web site
E-mail

Phone:	(978) 535-5900
Fax:	(978) 536-2205

Microscopes, All Types:

Microscopes are instruments that produce magnified images of small objects

Learn more about Microscopes, All Types.

Page: 1 2

Product Name	Notes
Automated Semiconductor Process Tools -- JFS-9855S / 9955S	Has a focused ion beam (FIB) milling system, automated wafer metrology
Automated Wafer Inspection SEMs -- JWS-7555S	Designed for fast in-line automated defect review and yield management
Automated Wafer Inspection SEMs -- JWS-7855S	Designed for fast in-line automated defect review and yield management
Automated Wafer Inspection SEMs -- JWS-8755S	Designed for fast in-line automated defect review and yield management
Conventional SEMs -- JSM-5510	Optimized for fitting and integrating X-ray spectrometers
Conventional SEMs -- JSM-5610	Optimized for fitting and integrating X-ray spectrometers
Conventional SEMs -- JSM-5910	Optimized for fitting and integrating X-ray spectrometers
Conventional SEMs -- JSM-6360	Optimized for fitting and integrating X-ray spectrometers
Conventional SEMs -- JSM-6460	Optimized for fitting and integrating X-ray spectrometers
Electron Probe Microanalyzer -- JXA-8100/8200	High resolving power for adjacent X-ray spectra
Field Emission SEMs -- JSM-6000F	Short focal length to give a smallest possible intense spot of electrons
Field Emission SEMs -- JSM-6335F	Improved resolution at all working distances and acceleration voltages
Field Emission SEMs -- JSM-6500F	Unique in-lens gun with Schottky emitter with strongly exited conical lens
Field Emission SEMs -- JSM-6700F	Handle up to 8 inch specimen through a new type of airlock.
Field Emission SEMs -- JSM-7400F	Electron filtering and further enhanced electron optics
High Voltage Transmission -- JEM-4010	These instruments are the present ultimate in atomic resolution
High Voltage Transmission -- JEM-ARM1000	These instruments are the present ultimate in atomic resolution
High Voltage Transmission -- JEM-ARM1300	These instruments are the present ultimate in atomic resolution
Low Vacuum SEMs -- JSM-5510LV	Low pressure neutralizes charge on uncoated, non-conducting materials
Low Vacuum SEMs -- JSM-5610LV	Low pressure neutralizes charge on uncoated, non-conducting materials
Low Vacuum SEMs -- JSM-5910LV	Low pressure neutralizes charge on uncoated, non-conducting materials
Low Vacuum SEMs -- JSM-6360LV	Low pressure neutralizes charge on uncoated, non-conducting materials
Low Vacuum SEMs -- JSM-6460LV	Low pressure neutralizes charge on uncoated, non-conducting materials
Scanning Probe Microscopes -- JSPM-4200	Atomic resolution, software for instrument control & data processing,
Scanning Probe Microscopes -- JSPM-4500	Atomic resolution, software for instrument control & data processing,

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Company Description
About JEOL USA, Inc. JEOL USA, Inc. is a wholly owned subsidiary of JEOL, Ltd. of Akishima, Japan with corporate offices at 11 Dearborn Road in Peabody, Massachusetts. JEOL's primary business is the manufacture, sale and service of Electron Microscopes, such as SEMs and TEMs , and various... (more)

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