Portable spectrometers are modular devices that are designed for ease of transport and assembly. Rugged enclosures, PC interfaces and customizable software packages are common features for the portable device.
Atomic absorption spectrometers (AA) use the absorption of light to measure the concentration of gas-phase atoms. The analyte (usually liquids or solids) must be vaporized in a flame or a graphite furnace (temperature of 1000-2000 K).
Atomic emission spectroscopy (AES or OES [optical emission spectroscopy]) uses quantitative measurement of the optical emission from excited atoms to determine analyte concentration.
Raman spectroscopy is the measurement of the wavelength and intensity of inelastically scattered light from molecules. The spectrometer can determine chemical compositions based on the wavelengths and intensities.
X-ray fluorescence is a spectroscopic method that is commonly used for solids in which secondary X-ray emission is generated by excitation of a sample with X-rays. The X-rays eject inner-shell electrons. Outer-shell electrons take their place and emit photons in the process. The wavelength of the photons depends on the energy difference between the outer-shell and inner-shell electron orbitals. The amount of X-ray fluorescence is very sample dependent and quantitative analysis requires calibration with standards that are similar to the sample matrix.
Mass spectrometry (MS) is an analytical spectroscopic tool primarily concerned with the separation of molecular (and atomic) species according to their mass. MS can be used in the analysis of many types of samples, from elemental to large proteins and polymers.
Infrared (IR) spectroscopy is the measurement of the wavelength and intensity of the absorption of infrared light by a sample. The spectrometer can determine the composition of samples based on this absorption. This can include NIR spectroscopy, FTIR spectroscopy as well as other types of infrared spectroscopy.
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Resolution is the width of an analytical peak at half its height expressed in nanometers. It's a measure of the instruments ability to separate two overlapping peaks. At the point of resolution, two peaks of equal height are said to be resolved if you can see a dip between the tops of the two peaks.
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