Microscopy and Metallography Sample Preparation Equipment

Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Microscopy and metallography sample preparation equipment includes abrasive saws for producing thin slices of samples, grinding and polishing machinery, and a variety of coating and etching devices for preparing samples for electron microscopy.

Microscopy sample preparation equipment and metallography sample preparation equipment is used to prepare samples for viewing using light or electron microscopes. Microscopy and metallography sample preparation equipment includes sectioning saws and wire saws to prepare clean, smooth surfaces for viewing and analysis. A sectioning saw is designed to cut many types of materials without deforming the basic structure of the sample. A wire saw cuts sample material by using a diamond impregnated wire blade or a plain wire blade in conjunction with an abrasive. Cut-off machines are also used to prepare metallographic specimens, by cutting very small sections. The small pieces are then prepared for the microscope by securing them on special mounts using a mounting press. Mounting presses secure the sample on a setting die and may also coat it with platinum for use in an electron microscope.

Microscopy sample preparation equipment and metallography sample preparation equipment is also used to prepare histological or medical specimens. As part of sample preparation, organic tissue is usually cut by using a special device called a microtome. Microtomes slice the frozen tissue or tissue embedded in epoxy into thin sections. Tissue prepared for viewing under an electron microscope is sliced into very thin sections, usually measured in nanometers.

Microscopy sample preparation equipment and metallography sample preparation equipment also includes devices called ion mills. Ion mills are used to create thin sections in samples for transmission electron microscopy (TEM). Ion mills bombard a sample with a stream of ions at a specified angle, producing specific areas that are thinned out in the sample and most suitable for analysis.

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