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Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More about X-ray Fluorescence Spectrometers
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More about X-ray Instruments and X-ray Systems
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More about X-ray Tubes and Sources
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More about Machine Vision Systems
...ray fluorescence analysis. A laser preparation sample may be a powdered specimen sample or a biological specimen treated with specific nucleic acids or proteins. Laboratories that use specialty sample preparation equipment have a variety... Learn More about Specialty Sample Preparation Equipment
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More about Imaging Workstations
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers
Metal sheet is metal or alloy stock supplied or available in the form of sheet or foil. Metal sheet has a thickness between 0.006" and 0.250", and is 24" (609.6 mm) or more in width. Search by Specification | Learn More about Metal Sheet
Mass spectrometers separate ions by their mass-to-charge (m/z) ratios. They are used to identify compounds by the mass of one or more elements in the compound. They are also used to determine the isotopic composition of one or more elements in a compound. Search by Specification | Learn More about Mass Spectrometers
...dimensional gages and instruments, eddy current instruments, hardness testers, materials testing equipment, magnetic particle equipment, microscopes and optical instruments, probes and styli, ultrasonic instruments, video imaging equipment, and X... Search by Specification | Learn More about Test Equipment and Instrument Repair Services
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More about Radiation Shielding
...use sieving, dynamic light scattering, electrozone sensing, laser diffraction, low angle light scattering (LALLS), microscopy, or sedimentation. Companies that perform X-ray radiography, scanning acoustic microscopy (SAM), auger spectroscopy (AES... Search by Specification | Learn More about Analytical Laboratory Services
Specialty or proprietary products and accessories related to spectrometers. Learn More about Specialty Spectrometers and Accessories
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EDX-GP X-ray Fluorescence Spectrometer Shimadzu Scientific Instruments, Inc.
Solutions for Consumer Protection Safety Act Fischer Technology, Inc. / Coating Thickness Gages
Fischer XAN Series for Gold Analysis Fischer Technology, Inc. / Coating Thickness Gages
X-MET5100 for RoHS Compliance Screening... Oxford Instruments / Industrial Analysis
New EDXRF Spectrometer - X-Supreme8000 Oxford Instruments / Industrial Analysis
X-ray Spectrometer for Quantitative Analysis Fischer Technology, Inc. / Coating Thickness Gages
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Users of commercial off the shelf components are faced with a potentially dangerous parts shortage. It is possible that electronics thought to contain a minimum percentage of tin lead specified for medical components will be mislabeled and replaced with lead-free components. Fischer X-ray fluorescence instruments identify lead and lead free components. (read more)
X-ray fluorescence (XRF) spectrometry is a powerful analytical technique for elemental analysis of a wide variety of materials in a highly precise and generally non-destructive way. XRF can be used for many elemental analysis applications, such as electronics, plastics, rubbers, geology, forensics, and WEEE / RoHS / ELV compliance testing. (read more)
The EDX-GP, the newest model in Shimadzu's EDX series, offers fast, high-sensitivity measurements optimized for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users. (read more)
X-Ray Fluorescence Instruments for WEEE/RoHS by Fischer Technology The FISCHERSCOPE X-RAY XAN and XDAL identify the content of prohibited metals in compliance to the EU directive RoHS/WEEE (read more)
The PXS10-65W and PXS10-800 are MicroFocus X-Ray sources for applications requiring high power and high resolution. They operate from 45kV-130kV at up to 65W. They offer <6µm spot size and FOD of 14mm for excellent resolution and magnification. The completely integrated units combine a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
The PXS10-16W is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 130kV at up to 16W. It offers focal spot size down to <5µm and a focus-to-object distance of 14mm for excellent resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
The PXS5-925EA is a MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV-90kV at up to 8W. It features a focal spot down to 7µm and a Focus-to-Object Distance (FOD) of 12mm for excellent resolution and magnification. The compact case houses an end-window sealed tube and high voltage power supply in a unit weighing only 8lbs. (read more)
The PXS5-724EA is an end-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 70kV at up to 7W. The focal spot is <20µm at 7W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
The PXS5-927 is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 20kV - 90kV at up to 8W. It features a round focal spot with size down to 4µm and a working distance of 8.5mm for outstanding resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
The PXS5-822SA is a side-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 80kV at up to 8W. The focal spot is <20µm at 8W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
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MATLAB Central - File detail - Atomic Resolution Reciprocal... Atomic Resolution Reciprocal X-ray Fluorescence Holography (reciprocal XFH)l See MathWorks, Inc. (The) Information |
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X-ray - Wikipedia, the free encyclopedia Originally, the electromagnetic radiation emitted by X-ray tubes had a longer wavelength than the radiation emitted by radioactive nuclei (gamma |
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Micro-X-ray fluorescence - Wikipedia, the free encyclopedia [edit Micro-X-Ray Fluorescence Micro-x-ray fluorescence(MXRF) is among the newest technology used to detect fingerprints. |
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Neutron - Radiation detection - Re: Homebrew X-ray... Subject Re: Homebrew X-ray fluorescence Posted by Jon Rosenstiel on 2004-04-14 20:20 |
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RoHS/WEEE and ED XRF Thermo Scientific X-Ray Fluorescence (XRF) is the phenomenon where a material is exposed to x-rays of high energy, and as the X-ray strikes an atom or molecule in the |
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Microbeam XRF Benchtop System-Thermo Scientific MicroXR GXR Microbeam X-ray Fluorescence System |
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NASA - NSSDC - Experiment - Details X-Ray Fluorescence Spectrometer (XRFS) NSSDC ID: 1975-083C-13 Mission Name: Viking 2 Lander Principal Investigator: Dr. Priestley Toulmin, III |
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ASTM C1254 -99(2005) Standard Test Method for Determination of... ASTM C1254 - 99(2005) Standard Test Method for Determination of Uranium in Mineral Acids by X-Ray Fluorescence See ASTM International Information |
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Chemical Analysis of Portland Cement by Energy Dispersive... Chemical Analysis of Portland Cement by Energy Dispersive X-Ray Fluorescence Wheeler, BD Staff scientist and director, EG&G ORTEC, Materials Analysis See ASTM International Information |
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edax - Home EDAX Launches Orbis, The Next Generation of Micro X-ray Fluorescence Spectrometer X-ray Microanalysis TSL Crystallography See EDAX, Inc. Information |