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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Products/Services for tunneling microscopy scanning
These microscopes are generally lightweight and handheld. Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic... Search by Specification | Learn More about Specialty Microscopes
...including biological or life science, gemological, medical or forensic, metallurgical, measuring or inspection and semiconductor inspection. Electron microscopes are one of two main types: scanning electron microscopes (SEM) and transmission... Search by Specification | Learn More about Electron Microscopes
...field, scanning electron microscope (SEM), scanning force or atomic probe microscope (SFM/AFM), stereoscopes and transmission electron microscopes. Acoustic and ultrasonic microscopes, compound microscopes, and fluorescent and UV microscopes... Search by Specification | Learn More about Microscopes
...and mechanical testing. Analytical laboratory services may also use various microscopy and metallography techniques and perform nondestructive testing (NDT), property testing, opacity testing, optical emission spectroscopy, scanning electron... Search by Specification | Learn More about Analytical Laboratory Services
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn More about Microscopy and Metallography Sample Preparation Equipment
Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Learn More about Web Sensing and Scanning Systems
Scanning software is used with optical and document scanners or with other imaging equipment to digitize, create, edit and evaluate images. Learn More about Scanning Software
...per inch). PCS stands for Print Contrast Signal, it measures the contrast level between background and bars to be high enough for consistent reads. The scan rate is the number of scans per second the scanner can differentiate between. The minimum... Search by Specification | Learn More about Handheld Bar Code Scanners
...microscopes transmit light or use environmental scanning electron microscopy (SEM). Gemological devices use polarized light with lower magnifying powers to produce sharp, bright images in a wide field of view. Measuring microscopes are used to measure... Search by Specification | Learn More about Optical and Light Microscopes
Fixed mount bar code scanners are designed to manually or mechanically read items passed by their scan windows. Unlike hand scanners, they are affixed to a single location. Search by Specification | Learn More about Fixed Mount Bar Code Scanners
...testing, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some material testing services test materials used in aerospace, automotive... Search by Specification | Learn More about Material Testing Services
...or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), stereoscopes and transmission electron microscopes (TEM). Important parameters... Search by Specification | Learn More about Metallurgical Microscopes
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers
...microscopes, microwave microscopes, fluorescent microscopes, laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission... Search by Specification | Learn More about Measuring Microscopes
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More about Dimensional Measurement and Metrology Services
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BioScope™ Catalyst™ Atomic Force Microscope Veeco Instruments
Dimension® Icon™ Atomic Force Microscope Veeco Instruments
Insight 3D Atomic Force Microscope Veeco Instruments
MX-BGAZ II Hirox-USA, Inc.
Innova AFM Veeco Instruments
STM6® Series Measuring Microscopes Olympus America Inc.
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Product News for tunneling microscopy scanning
Dimension V Scanning Probe Microscope (SPM)
Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)
Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
MultiMode V
The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller. (read more)
Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
PInano™ XY & XYZ Piezo Stage for Microscopy P-545
The PInano is a low profile, closed-loop piezo stage for super-resolution microscopy, such as single molecule microscopy. It comes in XY and XYZ configurations. An optional manual XY microscopy stage allows easy installation. (read more)
Piezo Z-Stage / XY- Piezo Stage for Microscopy
PI's new P-541 nanopositioning piezo z-stage & piezo XY-stage family provides fast multiaxis motion to 200x200 (100 µm in Z), resolution to 0.1 nanometers in an extremely low profile package. Features: large aperture (beneficial in optical inspection and microscopy); parallel-kinematics flexure guiding system for friction free motion; nanometer precision trajectory control. (read more)
Low Cost Piezo Z- Stage for Microscopy
The P-612 precision Z-stage is a cost-effective, compact, piezo-based nano-positioning system with a travel range of 100 µm, for applications such as z-stack imaging. The space-saving design features a footprint of only 60 x 60 mm. The 20 x 20 mm clear aperture makes them ideally suited for sample positioning in microscopy. (read more)
High Resolution Digital CCD Microscopy Camera
Lumenera's INFINITY4-11 digital CCD camera is based on the Kodak KAI-11002 progressive scan CCD sensor. Matching the field of view of a 35mm camera with a 43.3mm diagonal, and boasting superior color reproduction, this camera is ideal for high-end scientific, industrial, medical, ophthalmic and life science applications. (read more)
Laser Scanning Technology Assists National Guard
When your mission is to collect information to assist with life threatening situations, there is no room for mistakes. This need for accuracy led researchers at the West Virginia University Research Corp. and the National Guard to ShipShaper, an engineering service provider. With accuracy and speed in mind, ShipShaper employed laser scanning technology from FARO Technologies. (read more)
Conduct Research
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Scanning Tunneling Microscopy: A tool for Studing Self-Assembly and Model Systems for Molecular Devices (AN85)
The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling...(read more)
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Modern Trends in AFM of Polymers (AN84)
Initially introduced as an accessory to scanning tunneling microscopy (STM), atomic force microscopy (AFM) has become an advanced and most valuable scanning probe technique broadly used in academic...(read more)
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Torsional Ressonance Tunneling (TR TUNA) AN107
® The implementation of a torsional drive TUNA can be applied to many research cycle in a regime having no near-fi eld system for use with AFMs from Veeco or manufacturing areas on a wide...(read more)
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Electrical Characterization with Scanning Probe Microscopes (AN79)
The ongoing evolution of scanning probe microscopy has yielded analytical instruments featuring numerous capabilities for a wide range of applications. The ability of these instruments to perform...(read more)
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Scanning Probe/Atomic Force Microscopy: A Technology Overview (AN48)
Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunneling microscopes (STMs). In their first...(read more)
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IBM Technical Journals Scanning tunneling microscopy 1995 Design and applications of a scanning SQUID microscope |
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IBM Technical Journals Atomic force microscopy (AFM) Automata Electron microscopy Electron trap characterization |
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Microscopy - Wikipedia, the free encyclopedia There are three well-known branches of microscopy, optical, electron and scanning probe microscopy. |
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Scanning probe microscopy - Wikipedia, the free encyclopedia Scanning probe microscopy Atomic force microscope Scanning tunneling microscope |
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The World-Wide Web Virtual Library: Microscopy Microscopy This page of the WWW-Virtual Library covers all aspects of light microscopy, electron microscopy and other forms of microscopy. |
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WWW-VL Microscopy: Scanned Probe Microscopy Microscopy: Atomic Force and Scanning Probe Microscopy Blaine's Scanning Probe Microscopy Page - a nice collection of annotated SPM links |
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Publications, SPM Group, Department of Physics, University of... Observation of electron tunneling induced photon emission in gallium (Ga) doped (1%) zinc oxide (ZnO) sample using Scanning Tunneling Microscopy. |
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Scanning tunneling microscopy - What does STM stand for?... scanning switch Scanning Synthetic Aperture Radar Scanning Television Radiometer Scanning Thermal Microscopy Scanning Thermal Wave Microscopy |
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Scanning Tunneling Electron Microscopy - What does STEM stand... Scanning transmission electron microscopy Scanning transmission electron microscopy Scanning transmission electron microscopy Scanning Transmission |
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Scanning Tunneling Microscopy/Atomic Force Microscopy for... Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents) See Storming Media LLC Information |
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