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Products/Services for SPM
These microscopes are generally lightweight and handheld. Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic... Search by Specification | Learn More about Specialty Microscopes
A stylus may be slightly curved so that it can be gripped easily. SPM styli or cantilevers are used to probe an image surface on an atomic scale. Profilometer styli operate on a broader scale and are drawn across a surface to measure surface roughness... Learn More about Styli and Probes
...by the length or area scanned. Scanning probe microscopes (SPM microscopes) and atomic force microscopes (AFM microscopes) are used to study surface features by moving a sharp probe over the object's surface. Atomic force microscopes... Search by Specification | Learn More about Microscopes
...other so that the only light that passes through the specimen reaches the eyepiece. Portable field microscopes are lightweight devices that include an energy source such as a battery. Scanning electron microscopy (SPM) forms images with a detector... Search by Specification | Learn More about Digital and Video Microscopes
...laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission electron microscopes (TEM). The magnification... Search by Specification | Learn More about Biological Microscopes
...or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), stereoscopes and transmission electron microscopes (TEM). Important parameters... Search by Specification | Learn More about Metallurgical Microscopes
...microscopes, microwave microscopes, fluorescent microscopes, laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission... Search by Specification | Learn More about Measuring Microscopes
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
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BioScope™ Catalyst™ Atomic Force Microscope Veeco Instruments
Dimension® Icon™ Atomic Force Microscope Veeco Instruments
MX-BGAZ II Hirox-USA, Inc.
Insight 3D Atomic Force Microscope Veeco Instruments
Innova AFM Veeco Instruments
STM6® Series Measuring Microscopes Olympus America Inc.
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Product News for SPM
Caliber SPM
The NEW low-cost, high value Caliber scanning probe microscope (SPM) is the ideal entry level instrument for surface science research. (read more)
SPM Separated Geometry Lasers
Instead of being encased in a single unit, the diode and lens of our SPM separated geometry lasers are housed together in their own head assembly, separate from the driver. This configuration provides flexible mounting in tight spaces and allows for a wide variety of laser head and driver combinations. (read more)
Dimension V Scanning Probe Microscope (SPM)
Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)
SPM/SPF MOLDED RACE ROD ENDS FROM TUTHILL CONTROLS
Tuthill Controls' SPM/SPF Series molded race, industrial/commercial rod ends are designed for use in a multitude of applications and are the company's most versatile. The rod ends feature an injection-molded, reinforced nylon race construction with self-lubricating characteristics. The ball and body are made from low carbon steel and are zinc plated for corrosion resistance. (read more)
Innova AFM
You'll be amazed by the high-resolution, low-noise images from our new Innova AFM. (read more)
XYZ piezo stage scanner for AFM, STM
PicoCube™ XY and XYZ piezo stage scanning systems are ultra-high-performance, closed-loop piezoelectric scanning systems. Designed for AFM, SPM and nanomanipulation applications, they combine an extremely low-inertia (10 kHz resonant frequency!), high-speed piezo scanner with non-contact, direct-measuring, parallel-metrology capacitive feedback capable of 25 picometers resolution. (read more)
MultiMode V
The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller. (read more)
Rotary Damper Drives and Actuators
The Beck 11-430 offers up to 5200 lb-ft of torque in a precise and reliable electronic control drive. Now avaialble with a new cast gearbox and serrated cast crankarm for even more mounting ease and flexibility. (read more)
NanoMan VS
The preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. (read more)
UPCORP Brulin 815GD Ultrasonic Cleaning Detergent
Formula 815 GD is an immersion/ultrasonic detergent that is safe for use with ferrous, aluminum, and most soft metals and plastics. It is biodegradable with no chelants for easy disposal and contains no hazardous material on the MSDS as defined by OSHA 29CFR, 1910.1200 making it safe to handle and to use. (read more)
Parts by Number for SPM
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| SPM | PLC Radwell | MULTILIN | Not Provided | MOTOR PROT/CTRL |
| SPM593 | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
| SPM3205 | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
| SPM801906 | PLC Radwell | PARTLOW | Not Provided | RELAY KT |
Conduct Research
- Scanning-Probe Microscopy (SPM) Analysis for Thermoplastic Vulcanizates (TPVs)
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Biogas Thermal Mass Flow Meter Improves Operation of S.P.M. Feed Company's Methane Recovery System (.pdf)
In all biogas recovery systems, measuring the flow rate of methane and other mixed gases is required to ensure effective and efficient operation of the digester process and effective operation of the...(read more)
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Scanning Probe Microscopes and Atomic Force Microscopes
Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic force...(read more)
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AVR109: Self Programming
This application note describes how an AVR with the Store Program Memory (SPM) instruction can be configured for Self-programming. The sample application communicates via the UART with a PC running...(read more)
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3D MEMS Metrology with the Atomic Force Microscope (AN55)
Veeco Metrology Group, through its Digital Instruments and TM Microscopes divisions, offers several lines of scanning probe microscopes (SPM) capable of atomic force microscopy (AFM). Large sample...(read more)
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Triple DAC Configuration in NanoScope Controllers, Superior Control, Resolution, and Flexibility (AN23)
The system controller is a critical component of any Scanning Probe Microscopy (SPM) system. Digital Instruments NanoScope Controllers have set the industry standard since its inception over a decade...(read more)
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Lateral and Chemical Force Microscopy: Mapping Surface Friction and Adhesion (AN05)
Lateral Force Microscopy (LFM) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. Applied with contact mode atomic...(read more)
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Phase Imaging: Beyond Topography (AN11)
Phase Imaging is a powerful extension of TappingMode™ Atomic Force Microscopy (AFM) that provides nanometer-scale information about surface structure and properties often not revealed by other...(read more)
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SPM - Statistical Parametric Mapping SPM Menu: " />Introduction " />Software " />Documentation " />Courses " />Email list " />Data sets " />Extensions |
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V4 Mini DIP SPM Application Note (2008-03-03) Application Note... V4 Mini DIP SPM Application Note (2008-03-03) Application Note AN-9044 Smart Power Module Motion-SPM in Mini DIP SPM Ver.4 User's Guide Written by: See Fairchild Semiconductor Corporation Information |
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Smart Power Module (SPM®) Smart Power Module (SPM®) Contents Motion-SPM? in DIP | Motion-SPM? in Mini-DIP | Motion-SPM? in Tiny-DIP | SRM-SPM | PFC-SPM | Motor See Fairchild Semiconductor Corporation Information |
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GXSM: comedi_hwi_spm Class Reference comedi_hwi_spm Class Reference #include <comedi_hwi.h> Inheritance diagram for comedi_hwi_spm: |
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GXSM: LAN_rhk_hwi_spm Class Reference LAN_rhk_hwi_spm () virtual ~LAN_rhk_hwi_spm () LAN_rhk_hwi_spm Class Reference #include <LAN_rhk_hwi.h> |
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MATLAB Central - Files 2 5 99 brain directories files fmri imaging mri path spm utilities vers imaging, mri, spm, brain 30 0 19 Jun 2006 See MathWorks, Inc. (The) Information |
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SPM - MATLAB Link Exchange - MATLAB Central SPM http://www.fil.ion.ucl.ac.uk/spm/ First submitted by MATLAB Central Team on 12 Sep 2004 See MathWorks, Inc. (The) Information |
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SPM Instrument - Condition monitoring solutions SPM Instrument International Welcome to SPM Instrument - Condition Monitoring Professionals See SPM Instrument Inc. Information |
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FREE SHIPPING — Milwaukee Reciprocating Sawzall —... FREE SHIPPING ? Milwaukee Reciprocating Sawzall ? 2800 SPM, 120 Volt, 10 Amp, Model# 6519-22 Strokes Per Minute (SPM) 0 - 2,800 Case Included See Northern Tool + Equipment Information |
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FREE SHIPPING — Makita Cordless Reciprocating Saw —... FREE SHIPPING ? Makita Cordless Reciprocating Saw ? 2700 SPM, 9.6 Volt, 1.3 Amp, Model# 4390D Strokes Per Minute (SPM) 2,700 Tool Weight (lbs.) See Northern Tool + Equipment Information |
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