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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find scanning probe microscope-related products, suppliers, datasheets and CAD.
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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
Specialty microscopes are designed for specific applications such as metallurgy or gemology. They use specialized techniques or technologies such as acoustics to produce magnification. Search by Specification | Learn More about Specialty Microscopes
Microscopes are instruments that produce magnified images of small objects Search by Specification | Learn More about Microscopes
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Search by Specification | Learn More about Measuring Microscopes
Metallurgical microscopes are used for metallurgical inspection including metals, ceramics, and other materials. Search by Specification | Learn More about Metallurgical Microscopes
Biological microscopes are used to study organisms and their vital processes. Search by Specification | Learn More about Biological Microscopes
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution. Search by Specification | Learn More about Digital and Video Microscopes
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More about Styli and Probes
Microscope accessories and microscope supplies are used with many different types of microscopes, including dissection or stereoscopic, compound, and confocal devices. Learn More about Microscope Accessories and Supplies
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More about CMM Probes
Optical and light microscopes use the visible or near-visible portion of the electromagnetic spectrum to magnify images of objects. Search by Specification | Learn More about Optical and Light Microscopes
Microscope stages are platforms where specimens are placed for observation with a microscope. They are often equipped with a mechanical device which holds the specimen slide in place, but allows the back-and-forth and side-to-side movement of the slide. Search by Specification | Learn More about Microscope Stages
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More about Nondestructive Testing (NDT) Probes
Microscope lenses and microscope objectives include eyepieces or oculars, optical filters, objectives, adapters or mounts, condensers and other optical components for microscopy. Learn More about Microscope Lenses and Objectives
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Desktop electron microscopy: empowering the user FEI Company
Phenom — the First "Point and Shoot" Desktop SEM FEI Company
Introducing the FEI Fibermetric System FEI Company
Electron Imaging Can Improve Your Science Courses FEI Company
Sub-micron imaging for metallurgical applications FEI Company
Phenom FEI Company
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Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)
The NEW low-cost, high value Caliber scanning probe microscope (SPM) is the ideal entry level instrument for surface science research. (read more)
Innovative force-measurement features and handheld PicoAngler force-feedback device allows quantified and tactile interpretations of molecular structure. (read more)
AFM with a sealed hermetic sample chamber for control of sample atmosphere and temperature. (read more)
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
You'll be amazed by the high-resolution, low-noise images from our new Innova AFM. (read more)
The preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. (read more)
The new Digital Eclipse C1si, a confocal laser fluorescence microscope system, delivers true spectral imaging through fast one-shot 32 channel capture at the highest resolution. (read more)
The A-Zoom2 is a variable power viewing system that represents the next generation of analytical microscopes for use in microelectronics inspection, development, testing, and analysis. (read more)
The inverted microscopes is a very popular platform for automation due to their stability and optical performance. Inverted microscopes typically permit the least amount of freedom for stage design. (read more)
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Scanning probe microscopy - Wikipedia, the free encyclopedia (Redirected from Scanning probe microscope) Scanning probe microscopy Atomic force microscope Scanning tunneling microscope |
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Microscopy - Wikipedia, the free encyclopedia microscopy) or by scanning of a fine beam over the sample (for example confocal laser scanning microscopy and scanning electron microscopy). Scanning |
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Probe replacement method for scanning probe microscope... Abstract: A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe |
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Probe for scanning probe microscope and method of producing... Probe for scanning probe microscope and method of producing the same -> Monitor Keywords |
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Scanning probe microscope - What does SPM stand for? Acronyms... (redirected from Scanning probe microscope) Scanning Probe Microscope SPM Summary for Policy Makers |
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Polymer Surface & Interface Group: Equipment & Facilities Scanning probe microscope facility Optical tweezer facility |
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Scanning Thermal Conductivity Microscope Scanning Thermal Conductivity Microscope Scanning Thermal Conductivity Microscope provides both height and thermal conductivity contrast |
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Scanning Probe Microscope Software at FilesLand Scanning Probe Microscope Software barcode scanning |
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Scanning Probe Microscope Software Download - n-Surf Download Scanning Probe Microscope Software |
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IBM Technical Journals Design and applications of a scanning SQUID microscope |