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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Products/Services for Scanning Electron Microscopy, SEM
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
...and mechanical testing. Analytical laboratory services may also use various microscopy and metallography techniques and perform nondestructive testing (NDT), property testing, opacity testing, optical emission spectroscopy, scanning electron... Search by Specification | Learn More about Analytical Laboratory Services
...that transmit light or environmental scanning electron microscopes (SEM). Gemological microscopes use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Tool making specialty... Search by Specification | Learn More about Specialty Microscopes
...microscopes, microwave microscopes, fluorescent microscopes, laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission... Search by Specification | Learn More about Measuring Microscopes
...thermogravimetric analysis (TGA), dynamic thermal analysis (DTA). Other testing methods include chromatography, scanning electron microscopy (SEM), wet chemical analysis, and X-ray fluorescence (XRF) spectrometry. Material testing services are located... Search by Specification | Learn More about Material Testing Services
...or sieve analysis, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some chemical testing services test chemicals that are used... Search by Specification | Learn More about Chemical Testing Services
...microscopes transmit light or use environmental scanning electron microscopy (SEM). Gemological devices use polarized light with lower magnifying powers to produce sharp, bright images in a wide field of view. Measuring microscopes are used to measure... Search by Specification | Learn More about Optical and Light Microscopes
...field, scanning electron microscope (SEM), scanning force or atomic probe microscope (SFM/AFM), stereoscopes and transmission electron microscopes. Acoustic and ultrasonic microscopes, compound microscopes, and fluorescent and UV microscopes... Search by Specification | Learn More about Microscopes
Biological and life science microscopes transmit light or use environmental scanning electron microscopy (SEM). Digital and video microscopes are also used to examine the layers in semiconductor wafers and fabricated integrated circuit (IC) components... Search by Specification | Learn More about Digital and Video Microscopes
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn More about Microscopy and Metallography Sample Preparation Equipment
...or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), stereoscopes and transmission electron microscopes (TEM). Important parameters... Search by Specification | Learn More about Metallurgical Microscopes
...laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission electron microscopes (TEM). The magnification... Search by Specification | Learn More about Biological Microscopes
Environmental testing and analytical services provide testing of environmental samples such as soil, water, air, and industrial wastes or byproducts. Search by Specification | Learn More about Environmental Testing and Analysis Services
Geotechnical engineering services includes soil, rock and subsurface testing and analysis for site feasibility, foundations, embankments, pavements, retention structures, and other earthworks projects. Search by Specification | Learn More about Geotechnical Services
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More about Dimensional Measurement and Metrology Services
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Introducing the FEI Fibermetric System FEI Company
Electron Imaging Can Improve Your Science Courses FEI Company
Sub-micron imaging for metallurgical applications FEI Company
Phenom FEI Company
Phenom use for Pharmaceutical Inspection FEI Company
Desktop electron microscopy: empowering the user FEI Company
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Product News for Scanning Electron Microscopy, SEM
Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
Refractory Services at CERAM
CERAM, the-UK based parent company of The M&P Lab, is an international authority on refractory technology. With over 70 years' experience in this field, CERAM offers a full service of research and development, consultancy and testing services, on both the manufacture and the use of refractories to a wide range of industries, either directly or through its subsidiary companies. (read more)
Electron Microscopy
Microscopic examination of samples can provide important information for product failure problem solving and product development. (read more)
Desktop electron microscopy: empowering the user
In this webcast, a Phenom™ expert explains and demonstrates how the Phenom empowers new users to quickly take their own electron microscope images (read more)
Phenom — the First "Point and Shoot" Desktop SEM
FEI's Phenom is the first "Point and Shoot" desktop SEM. High-quality images are possible without specialized operators or facilities while eliminating the expense, delay, and difficulty of conventional SEM. (read more)
Electron Imaging Can Improve Your Science Courses
The Phenom personal electron microscope brings the sub-micron world within easy reach of teachers and students. (read more)
Sub-micron imaging for metallurgical applications
The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features (read more)
Failure Analysis Investigations
The M&P Lab can quickly identify root causes of failures to reduce down time, prevent reoccurrences, assess liability and increase fundamental understanding of materials and equipment in your process. Applying failure analysis during the design phase will yield improved durability and performance of new products. (read more)
Conduct Research
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Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) may include failure analysis, material analysis, and the elemental analysis (EDS) of extremely small particles. SEMs are electron microscopes in which the image is...(read more)
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Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complimentary Techniques for High Resolution Surface Investigations (AN46)
There are a wide range of analytical techniques which may be used for materials characterization depending on the type of information needed. For high resolution surface investigations, two commonly...(read more)
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Developments in Scanning Electron Microscopy for Tablet and Granule Characterization
Scanning electron microscopy (SEM) provides a qualitative assessment of size, shape, morphology, porosity, size distribution, crystal form, and consistency of powders or compressed dosage forms. This...(read more)
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Characterization of Materials by Electron Microscopy Techniques
Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) imaging is an effective means of determining morphological characteristics of materials. The presence of structural...(read more)
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Introduction of the S-4300SE SEM with Features and Some Applications (S-4300SE SEM 101)
New analytical techniques such as cathodoluminesence (CL) and electron backscattered diffraction pattern (EBSP) have been brought into scanning electron microscopy (SEM) in addition to high resolution...(read more)
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Studies of Metallic Surfaces and Microstructures with Atomic Force Microscopy (AN28)
Atomic Force Microscopy (AFM) is capable of generating 3D images of surface topography with nanometer and Ångstrom resolution. This powerful technology allows material scientists new insight into the...(read more)
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Evidence for Highly Localized Damage in Internal Tin and Powder-In-Tube Nb3Sn Strands Rolled Before Reaction Obtained from Coupled Magneto-Optical Imaging and Confocal Laser Scanning Microscopy (.pdf)
Nb3Sn strands for high-current, high-field magnets must be cabled before reaction while the conductor is still composed of ductile components. Even though still in the ductile, deformable state,...(read more)
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Ancient Gold Coins (AN524)
A series of French gold coins minted in 1786 bore Louis XVI's effigy with a notorious additional feature-each seems to include one, sometimes two, "horns" upon the king's forehead. (Figure 1). A...(read more)
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Tip Characterization and Surface Reconstruction of Complex Structures
Diminishing feature size, combined with requirements for higher throughput during quality control, have steadily increased demand for Critical Dimension Atomic Force Microscopy (CD AFM). In contrast...(read more)
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Analysis via SEM / EDS (.pdf)
The use of Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the analysis of failure related issues of printed circuit boards (PCBs), assemblies (PCAs), and electronic...(read more)
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Microscopy - Wikipedia, the free encyclopedia There are three well-known branches of microscopy, optical, electron and scanning probe microscopy. |
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2004 Building Publications - Scanning Electron Microscopy... Scanning Electron Microscopy Imaging of Hydraulic Cement Microstructure. Scanning Electron Microscopy Imaging of Hydraulic Cement Microstructure. |
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Analysis of the ASTM Round-Robin Test on Particle Size... Scanning Electron Microscopy (SEM) The SEM is an analytical tool that uses a focused beam of electrons to form magnified images. |
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Scanning Electron Microscopy SEM What is the SEM? Info on the Scanning Electron Microscope -includes a picture of the SEM. |
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Google Directory -... Electron Microscopy Science > Methods and Techniques > Microscopy > Electron Microscopy See Google, Inc. Information |
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World-Wide Web Virtual Library: Microscopy and Technology: Atomic Force Microscopy (AFM) | Crystallography & Diffraction | Confocal Laser Scanning Microscopy (CLSM) | Ion Beams | Nanotechnique |
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The Ultrastructure of the Electric Burn in Man: A Transmission... of the Electric Burn in Man: A Transmission Electron Microscopy-Scanning Electron Microscopy Study Torre, C Associate professor and post-graduate See ASTM International Information |
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Cement Clinker Characterization by Scanning Electron... Cement Clinker Characterization by Scanning Electron Microscopy Stutzman, PE Physical scientist, Building and Fire Research Laboratory, Inorganic See ASTM International Information |
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Scanning Electron Microscopy Testing - S & N Labs Support Fourier-Transform Infrared Spectroscopy (FT-IR) Scanning Electron Microscopy (SEM-EDX) Gas Chromatography ? Mass Spectroscopy (GCMS) High See S&N Labs, Inc. Information |
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Seeing more with scanning electron microscopy: SPIE Newsroom:... Seeing more with scanning electron microscopy |
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