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Products/Services for Raman Scatter
Raman spectrometers are used to measure the wavelength and intensity of inelastically scattered light from molecules. They can determine the chemical composition of a sample based on its wavelength and intensity. Learn More about Raman Spectrometers
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers
...removed from the frequency of the incident beam by quantities equal to the vibration frequencies of the material scattering system. Raman fiber optic amplifiers function within this small scattering range. If the initial beam is sufficiently intense... Search by Specification | Learn More about Fiber Optic Amplifiers
Optical diffusers scatter incident light, thereby reducing the sensitivity of a detection system to slight positional or angle changes in an incoming beam. Search by Specification | Learn More about Optical Diffusers
Infrared (IR) spectrometers measure the wavelength and intensity of the absorption of infrared light by a sample. Search by Specification | Learn More about Infrared Spectrometers
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
Scalar network analyzers measure the amplitude portion of scattering or S-parameters, reflection and transmission coefficients between the incident and reflection waves that describe a device’s behavior under linear conditions at the microwave Search by Specification | Learn More about Scalar Network Analyzers
...or attraction between particles. Particle analyzers may use blocking or attenuation, or diffraction or scattering techniques. Blockage or attenuation is based on a particle's ability to reduce the transmission of light, radiation (X-ray, beta... Search by Specification | Learn More about Particle Analyzers
Turbidity instruments measure the average volume of light scattering over a defined angular range. Both particle size and concentration of suspended solids as well as dissolved solids can affect the reading. Search by Specification | Learn More about Turbidity Instruments
Specialty lab and test equipment includes specialty or proprietary products and accessories related to laboratory testing. Learn More about Specialty Lab and Test Equipment
Mass spectrometers separate ions by their mass-to-charge (m/z) ratios. They are used to identify compounds by the mass of one or more elements in the compound. They are also used to determine the isotopic composition of one or more elements in a compound. Search by Specification | Learn More about Mass Spectrometers
Data storage media is used to record and store large-scale data from computer systems.. Examples include optical disks and magnetic tapes. Learn More about Data Storage Media
Ceramic and metal labware is used in applications where standard glass or plastic devices are inadequate. This includes fusion, reaction or incineration of samples for chemical analysis or material synthesis. Learn More about Ceramic and Metal Labware
Antennas are structures or devices used to collect or radiate electromagnetic waves. Search by Specification | Learn More about Antennas
Magnesium fluoride depolarizers are also useful in very narrow spectral ranges. Depolarizers are widely used in conjunction with Raman amplification, as the Raman scattering effect is highly dependant upon polarization, especially when used with pump... Search by Specification | Learn More about Depolarizers
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EZRaman-M Enwave Optronics, Inc.
EZRaman-I High Sensitivity System Enwave Optronics, Inc.
EZRaman-H Handheld Raman Analyzer Enwave Optronics, Inc.
ProRaman-6 Raman analyzers Enwave Optronics, Inc.
AvaRaman Fiber Optic Raman Spectroscopy System Avantes
NRS 3000 Series JASCO
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Product News for Raman Scatter
Infrared Spectroscopy System - Raman microscopes
Infrared spectroscopy can now be combined with Renishaw Raman microscopes to offer confocal Raman microscopy and infrared microscopy in a single instrument. This provides users with exceptional analytical power for identifying unknown materials by combining both vibrational spectroscopic techniques. This combined IR/Raman analysis simplifies a wide range of analytical... (read more)
ProRaman-6 Raman analyzers
The new ProRaman-6 Raman analyzers are high performance Raman instruments suitable for industrial applications or laboratory experiments that require high sensitivity Raman instruments at affordable costs. (read more)
EZRaman-H Handheld Raman Analyzer
Enwave's handheld Raman analyzers are ideal for Hazmat, police and security, and incoming material authentication applications. (read more)
EZRaman-xB field portable Raman
The new EZRaman-xB field portable Raman Analyzer enables Raman applications with great instrumentation performances and exceptional value.
EZRaman-xB system features a 785nm frequency-stabilized diode laser, a high resolution, TEC cooled CCD spectrograph achieving 10 cm-1 resolution and 2500-2,350 cm־¹ spectral coverage; and a high Rayleigh rejection probe. (read more)
New RMP-300 Series Portable Raman Spectrometer
JASCO has developed the new RMP-300 Series portable Raman spectrometer system, incorporating a fiber optic probe with a small X-Y-Z stage, compact laser, a high-throughput spectrograph and Peltier-cooled CCD detector. No special utilities such as coolants are required allowing the system to be used almost anywhere. (read more)
AvaRaman Fiber Optic Raman Spectroscopy System
Avantes AvaRaman Spectroscopy System is a high performance low cost Raman solution for educational and industrial applications (read more)
Turbidity: Haze Control Process Turbidity Meter
Ultra-Low Turbidity (Haze) - Three-Channel, Dual Angle Scattered-Light
The DTF16 Haze Control is a precise, inline turbidity measuring system featuring an advanced, triple-beam optical design. Sensitive forward scatter (11°) and standard side scatter (90°) measuring angles to measure a broad range of particles that contribute to turbidity and fine haze in the line. (read more)
Fiber Optic Assemblies
Fiberguide has been supporting the Original Equipment Manufacturer (OEM) in taking their concepts and ideas to market since 1977. Our staff of engineers, technical sales professionals and experienced production team unites in developing that product specific to your individual application. (read more)
EZRaman-I High Sensitivity System
Enwave's EZRaman-I Raman system is designed for great portability and convenience. This system provides the best performance, best sensitivity, and quality at a very competitive price. (read more)
Optical Waveguide Sensor Or Wavelength Devices
Unique polymer waveguide configurations based on novel OIL designs enable diverse optical devices to be constructed. Light is guided to and from the sensing or filter surface with no or minimal crosstalk or back scatter into the input waveguide. Designs for capillaries, scanners, or wavelength selectivity with inserted dielectric filters are possible and have been demonstrated. (read more)
Conduct Research
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Coherent Anti-Stokes Raman Scattering Microspectrometer
Coherent Anti-Stokes Raman Scattering (CARS) was first reported in 1965 by Maker and Terhune1 as a method of spectroscopy for chemical analysis. The energy diagram of the process is depicted in Figure...(read more)
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Raman Amplifiers
Raman amplifiers are optical amplifiers that function by tracking Raman scattering. When light is transmitted through matter, part of the light is scattered in random directions. A small part of the...(read more)
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Dispersive Raman Spectrometers
Dispersive Raman spectrometers measure the wavelength and intensity of inelastically-scattered light. They use visible lasers, a grating, and charged-coupled detectors (CCD) to collect data. In most...(read more)
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Two-Photon Excited Fluorescence Microscopy
Several laser-scanning microscopy techniques have been developed in the last twenty years based on non-linear optical phenomena.1 This has led to a variety of powerful imaging tools, such as...(read more)
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Scattering - Wikipedia, the free encyclopedia however, as a well-controlled laser beam can be exactly positioned to scatter off a microscopic particle with a deterministic outcome. |
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Application Confocal Raman Microscopy Analysis of Note: 51718... detector now collects Raman scatter from the middle sample layer; (c) the detector collects Raman scatter from the bottom layer. |
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Macro Sample Handling Tools for Raman Spectroscopy-Thermo... Where appropriate, the sample holders are gold coated for more efficient collection of Raman scatter. |
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Raman spectroscopy with a Fizeau interferometer: Publications:... Raman spectroscopy is performed by directing a laser (pump) beam onto a specimen, an extended scene, to induce Raman scatter. |
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Silicon Raman Laser Developed at UCLA: SPIE Newsroom: SPIE.org Silicon Raman Laser Developed at UCLA Eye on Technology - LASERS |
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Photon Systems, Inc. PL Raman Spectrometer TUCS (Targeted UV Sensor) Raman Spectroscropy Capillary Electrophoresis See Photon Systems, Inc. Information |
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Comparison of lidar water vapor measurements using Raman... Comparison of lidar water vapor measurements using Raman scatter at 266 nm and 532 nm |
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Determination of back-scatter coefficient from third-order... Determination of back-scatter coefficient from third-order Rayleigh effect in a Raman amplifier |
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NASA Glenn Research Center - Combustion Branch - Project -... The laser excitation causes the molecules to in-elastically scatter (or emit) a wavelength shifted light signal resulting from the Raman Effect. |
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Aluminum Impurities in Silicon: Investigation of X-ray Raman... Aluminum Impurities in Silicon: Investigation of X-ray Raman Scattering in Total Reflection X-ray Fluorescence Spectroscopy K. Baur, J. Kerner1, S. |
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