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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find precision measuring instrument-related products, suppliers, datasheets and CAD.
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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Search by Specification | Learn More about Measuring Microscopes
Coordinate measuring machines (CMMs) are mechanical systems designed to move a measuring probe to determine the coordinates of points on a work piece surface. Search by Specification | Learn More about Coordinate Measuring Machines (CMM)
Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn More about Dimensional Gages and Instruments
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. Search by Specification | Learn More about Temperature Instruments
Particle analyzers are used to determine the physical makeup of individual particulates in aerosols, dispersion, emulsions, powders, and other samples. Search by Specification | Learn More about Particle Analyzers
Data acquisition is the digitizing and processing of multiple sensor or signal inputs for the purpose of monitoring, analyzing and/or controlling systems and processes. Signal conditioning includes the amplification, filtering, converting, and other processes required to make sensor output suitable for rereading by computer boards. Search by Specification | Learn More about Data Acquisition
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn More about Surface Metrology Equipment
Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. Search by Specification | Learn More about Form Gages and Form Gaging Systems
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources. Search by Specification | Learn More about Interferometers
Rules are flat, graduated scales used for length measurement. For OEM applications, digital or electronic linear scales are often used. Search by Specification | Learn More about Rules and Scales
Data acquisition systems and instruments collect, digitize and process multiple sensor or signal inputs for the purpose of monitoring, analyzing and/or controlling systems and processes. Search by Specification | Learn More about Data Acquisition Systems and Instruments
Levels are mechanical or electronic tools that measure the inclination of a surface relative to the earth's surface. Search by Specification | Learn More about Levels
Linear position sensors is a general search form for all linear position / displacement detection product areas. Search by Specification | Learn More about Linear Position Sensors
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
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Automated 3D Wafer Metrology Tool DWFritz Automation, Inc.
Silicon Ingot Inspection System DWFritz Automation, Inc.
Semiconductor Thickness -- CHRocodile MI5 Precitec, Inc.
Motorized Semiconductor Wafer Shuttle Stage Prior Scientific, Inc.
Custom Specialty Dimensional Gages and Systems Visionx Inc.
Flat Panel Displays ULVAC Technologies, Inc.
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The Labmaster Universal bearing measuring instrument can measure a wide range of anti-friction bearings including tapered bearings, needle bearings, ball bearings, spherical bearings, and cylindrical bearings. Measure radial internal clearance (radial play) and axial internal clearance (axial play) with ease using our special fixturing. (read more)
Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the part by comparing the measurement probe position to the wavelength of a HeNe laser light source, effectively coupling the wavelength of light to the part being measured. (read more)
Mahr Dial Indicators are extremely versatile precision measuring instrument to be employed in production and in inspection rooms. (read more)
The new Malvern Spraytec spray sizing system provides users with in-situ, real-time measurements of the droplet size distributions produced by spray and aerosol devices. Using the technique of laser diffraction, it has been specifically designed to address the unique requirements of spray characterization, yielding robust... (read more)
Long Length Measuring Machines are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper. (read more)
Long Length Measuring Machines are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper. (read more)
To avoid contamination or gain feedback & identify progress in refining. For consistency in production to ensuring materials sourced meet your standards, and of course final inspection..... all are reasons to monitor color (or is it colour?). Perceptions and interpretations of colour are highly subjective, so the solution is an instrument that explicitly identifies a colour (read more)
Hamilton offers everything that is required of an instrument syringe: chemical inertness, long life, reduced friction and well-known Hamilton precision and accuracy. (read more)
The SMU-9000-6U1 measuring system is noncontact, has high sensitivity, and a custom design. (read more)
The Colby Instruments Model PDL-100A-OEM is the Electro-Mechanical Trombone Delay Line only for OEM applications and offers 0 to 625 ps of delay with a step resolution to 0.50 ps. (read more)
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 1720001522891 | MVP Micro, Inc. | BNS HOLDING INC. DBA BNS CO DIV PRECISION MEASURING INSTRUMENTS TESA USA | Not Provided | PUMP,SPECIAL |
| 1420015018374 | MVP Micro, Inc. | BNS HOLDING INC. DBA BNS CO DIV PRECISION MEASURING INSTRUMENTS TESA USA | Not Provided | COLLET,MOUNTING |
| 1620011178980 | MVP Micro, Inc. | BNS HOLDING INC. DBA BNS CO DIV PRECISION MEASURING INSTRUMENTS TESA USA | Not Provided | SWIVEL,DIAL INDICAT |
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CSA Newsletter, Spring '02: Measuring with Precision and... Measuring with Precision and Accuracy Total stations have become the standards to which other surveying instruments are compared. |
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Wilkinson Microwave Microwave Anisotropy Probe curvature of space to within 1% of "flat" Euclidean, improving on the precision of previous award-winning measurements by over an order of magnitude |
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Global Precipitation Measurement is covered by water and many countries are not equipped with precision rain measuring sensors (i.e., rain gauges and/or radars). It might be possible |
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Fowler Company Home Page QUALITY MEASURING INSTRUMENTS AND PRECISION TOOLS See Fred V. Fowler Co., Inc. Information |
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Gem Instrument Co. Brunswick, Ohio Gem Instrument Co. E-mail this company http://www.gem-instrument.com 2832 Nationwide Pkwy., P.O. Box 830 Brunswick, OH 44212 Phone: 330-273-6117 Fax: See ThomasNet Information |
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precision measuring instrument Precision measuring instrument Accueil |
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Abstracts: Precision instrument industry. part 2 Precision instrument industry Article Abstract: |
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Hand Tools, Specialty Hand Tools, Woodworking Tools, Test... See General Tools & Instruments Co., LLC. Information |
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Fluke Electronics Fluke Test Tools & Precision Measurement See Fluke Corporation Information |
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Modern precision multimeter measurements - putting theory to... Calibration software, measuring instrument design, metrology training and documentation all (to a greater or lesser degree) influence our |
