Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Search by Specification | Learn More about Measuring Microscopes

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments

Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn More about Surface Metrology Equipment

Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. Search by Specification | Learn More about Temperature Instruments

...instruments and sensors. Instead, masters gages and setting gages provide dimensional standards for calibrating other gages. Masters gages and setting gages are designed to variety of tolerance grades in both metric and English dimensions. Gage blocks... Search by Specification | Learn More about Masters and Setting Gages

Vibration instruments are used for measuring, displaying and analyzing vibration. Typically these instruments comprise a transducer, data acquisition and either a local display or some sort of output to a computer or another instrument. Search by Specification | Learn More about Vibration Instruments

Others use microscopy and image analysis. Ferrography instruments or ferrographs apply a magnetic field to a dispersion of contamination or ferromagnetic (e.g., steel, cast iron) wear particles in oil, lubricant, grease, fuel, hydraulic fluids and other... Search by Specification | Learn More about Particle Analyzers

Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources. Search by Specification | Learn More about Interferometers

...parameters during thin film or semiconductors wafer processing. Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer... Search by Specification | Learn More about Wafer and Thin Film Instrumentation

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Search by Specification | Learn More about Surface Profilometers

Coordinate measuring machines (CMMs) are mechanical systems designed to move a measuring probe to determine the coordinates of points on a work piece surface. Search by Specification | Learn More about Coordinate Measuring Machines (CMM)

Test equipment and instrument repair services test and repair industrial equipment and instruments. They specialize in the test and repair of acoustic and vibration equipment, electrical and electronic test equipment, laboratory equipment Search by Specification | Learn More about Test Equipment and Instrument Repair Services

Density and specific gravity instruments are meters used to determine density and specific gravity. Search by Specification | Learn More about Density and Specific Gravity Instruments

Weather instruments are designed to measure one or multiple components of weather including wind speed and direction, rain or snow fall, solar radiation, temperature, pressure and humidity. Search by Specification | Learn More about Weather Instruments