Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers

Mass spectrometers separate ions by their mass-to-charge (m/z) ratios. They are used to identify compounds by the mass of one or more elements in the compound. They are also used to determine the isotopic composition of one or more elements in a compound. Search by Specification | Learn More about Mass Spectrometers

UV and visible spectrometers measure the amount of ultraviolet (UV) and visible light transmitted or absorbed by a sample placed in the spectrometer. Search by Specification | Learn More about UV and Visible Spectrometers

X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More about X-ray Fluorescence Spectrometers

Atomic emission and optical emission spectrometers determine analyte concentration via a quantitative measurement of the optical emission from excited atoms. Atomic emission and optical emission spectrometers determine analyte... Search by Specification | Learn More about Atomic Emission and Optical Emission Spectrometers

Atomic absorption (AA) spectrometers use the absorption of light to measure the concentration of gas-phase atoms. Atomic absorption (AA) spectrometers use light absorption to measure the concentration of gas-phase atoms. An analyte, usually... Search by Specification | Learn More about Atomic Absorption Spectrometers

Specialty or proprietary products and accessories related to spectrometers. Learn More about Specialty Spectrometers and Accessories

Raman spectrometers are used to measure the wavelength and intensity of inelastically scattered light from molecules. They can determine the chemical composition of a sample based on its wavelength and intensity. Learn More about Raman Spectrometers

Residual gas analyzers (RGAs) identify the gases present in vacuum environments. Residual gas analyzers (RGAs) are spectrometers that are used to identify the gases present in vacuum environments. Residual gas analyzers perform this function... Search by Specification | Learn More about Residual Gas Analyzers

Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes

...referred to as luminescence spectrometers, fluorimeters, fluorescence spectrometers or spectrofluorometers. The important parameters measured by fluorometers are the spectral or wavelength range and the accuracy and resolution of that reading. Common... Search by Specification | Learn More about Fluorometers

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation

...instruments, freezers or refrigerators, furnaces and ovens, gas and air instruments, humidity and moisture instruments, leak testing equipment, level sensors and instruments, pressure instruments, process controllers and control systems, spectrometers... Search by Specification | Learn More about Test Equipment and Instrument Repair Services

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments