|
|
|
Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find microscopy scanning electron-related products, suppliers, datasheets and CAD.
 |
FREE GlobalSpec e-Newsletters
Receive the latest news, trends, and technology relevant to your work. (See Titles) |
Products/Services for microscopy scanning electron
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
...and mechanical testing. Analytical laboratory services may also use various microscopy and metallography techniques and perform nondestructive testing (NDT), property testing, opacity testing, optical emission spectroscopy, scanning electron... Search by Specification | Learn More about Analytical Laboratory Services
...that transmit light or environmental scanning electron microscopes (SEM). Gemological microscopes use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Tool making specialty... Search by Specification | Learn More about Specialty Microscopes
...field, scanning electron microscope (SEM), scanning force or atomic probe microscope (SFM/AFM), stereoscopes and transmission electron microscopes. Acoustic and ultrasonic microscopes, compound microscopes, and fluorescent and UV microscopes... Search by Specification | Learn More about Microscopes
...microscopes, microwave microscopes, fluorescent microscopes, laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission... Search by Specification | Learn More about Measuring Microscopes
...testing, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some material testing services test materials used in aerospace, automotive... Search by Specification | Learn More about Material Testing Services
...or sieve analysis, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some chemical testing services test chemicals that are used... Search by Specification | Learn More about Chemical Testing Services
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn More about Microscopy and Metallography Sample Preparation Equipment
...microscopes transmit light or use environmental scanning electron microscopy (SEM). Gemological devices use polarized light with lower magnifying powers to produce sharp, bright images in a wide field of view. Measuring microscopes are used to measure... Search by Specification | Learn More about Optical and Light Microscopes
...other so that the only light that passes through the specimen reaches the eyepiece. Portable field microscopes are lightweight devices that include an energy source such as a battery. Scanning electron microscopy (SPM) forms images with a detector... Search by Specification | Learn More about Digital and Video Microscopes
...or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), stereoscopes and transmission electron microscopes (TEM). Important parameters... Search by Specification | Learn More about Metallurgical Microscopes
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More about Dimensional Measurement and Metrology Services
...laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission electron microscopes (TEM). The magnification... Search by Specification | Learn More about Biological Microscopes
Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Learn More about Web Sensing and Scanning Systems
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation. Search by Specification | Learn More about Thin Film Equipment
|
||||||||
Phenom — the First "Point and Shoot" Desktop SEM FEI Company
Introducing the FEI Fibermetric System FEI Company
Electron Imaging Can Improve Your Science Courses FEI Company
Sub-micron imaging for metallurgical applications FEI Company
Phenom FEI Company
Phenom use for Pharmaceutical Inspection FEI Company
|
Product News for microscopy scanning electron
Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
Electron Imaging Can Improve Your Science Courses
The Phenom personal electron microscope brings the sub-micron world within easy reach of teachers and students. (read more)
Electron Microscopy
Microscopic examination of samples can provide important information for product failure problem solving and product development. (read more)
Desktop electron microscopy: empowering the user
In this webcast, a Phenom™ expert explains and demonstrates how the Phenom empowers new users to quickly take their own electron microscope images (read more)
PInano™ XY & XYZ Piezo Stage for Microscopy P-545
The PInano is a low profile, closed-loop piezo stage for super-resolution microscopy, such as single molecule microscopy. It comes in XY and XYZ configurations. An optional manual XY microscopy stage allows easy installation. (read more)
Piezo Z-Stage / XY- Piezo Stage for Microscopy
PI's new P-541 nanopositioning piezo z-stage & piezo XY-stage family provides fast multiaxis motion to 200x200 (100 µm in Z), resolution to 0.1 nanometers in an extremely low profile package. Features: large aperture (beneficial in optical inspection and microscopy); parallel-kinematics flexure guiding system for friction free motion; nanometer precision trajectory control. (read more)
Low Cost Piezo Z- Stage for Microscopy
The P-612 precision Z-stage is a cost-effective, compact, piezo-based nano-positioning system with a travel range of 100 µm, for applications such as z-stack imaging. The space-saving design features a footprint of only 60 x 60 mm. The 20 x 20 mm clear aperture makes them ideally suited for sample positioning in microscopy. (read more)
High Resolution Digital CCD Microscopy Camera
Lumenera's INFINITY4-11 digital CCD camera is based on the Kodak KAI-11002 progressive scan CCD sensor. Matching the field of view of a 35mm camera with a 43.3mm diagonal, and boasting superior color reproduction, this camera is ideal for high-end scientific, industrial, medical, ophthalmic and life science applications. (read more)
Conduct Research
-
Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) may include failure analysis, material analysis, and the elemental analysis (EDS) of extremely small particles. SEMs are electron microscopes in which the image is...(read more)
-
Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complimentary Techniques for High Resolution Surface Investigations (AN46)
There are a wide range of analytical techniques which may be used for materials characterization depending on the type of information needed. For high resolution surface investigations, two commonly...(read more)
-
Developments in Scanning Electron Microscopy for Tablet and Granule Characterization
Scanning electron microscopy (SEM) provides a qualitative assessment of size, shape, morphology, porosity, size distribution, crystal form, and consistency of powders or compressed dosage forms. This...(read more)
-
Studies of Metallic Surfaces and Microstructures with Atomic Force Microscopy (AN28)
Atomic Force Microscopy (AFM) is capable of generating 3D images of surface topography with nanometer and Ångstrom resolution. This powerful technology allows material scientists new insight into the...(read more)
-
Closing the Imaging Gap Between Optical and Electron Microscopy
A new tabletop SEM combines the high magnification of electron microscopy with the ease of use of optical microscopy to improve performance in a benchtop instrument. A radical new breed of microscope...(read more)
-
Characterization of Materials by Electron Microscopy Techniques
Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) imaging is an effective means of determining morphological characteristics of materials. The presence of structural...(read more)
-
Evidence for Highly Localized Damage in Internal Tin and Powder-In-Tube Nb3Sn Strands Rolled Before Reaction Obtained from Coupled Magneto-Optical Imaging and Confocal Laser Scanning Microscopy (.pdf)
Nb3Sn strands for high-current, high-field magnets must be cabled before reaction while the conductor is still composed of ductile components. Even though still in the ductile, deformable state,...(read more)
-
3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology (AN91) (.pdf)
3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology double for each device node at 90nm Introduction and below, which means a significant As increasing demand...(read more)
-
Microscopy of Biological Sections using a Low Voltage STEM Technique (S-5200 SEM 102)
A low voltage STEM technique using a scanning electron microscope (SEM) allows high contrast images owing to high electron scattering and making visible subtle changes of densities and compositions in...(read more)
-
Scanning Tunneling Microscopy: A tool for Studing Self-Assembly and Model Systems for Molecular Devices (AN85)
The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling...(read more)
|
ANL Microscopy and Microanalysis WWW Server Welcome to the Microscopy & Microanalysis WWW Site http:// www.amc.anl.gov |
|
|
The World-Wide Web Virtual Library: Microscopy Microscopy This page of the WWW-Virtual Library covers all aspects of light microscopy, electron microscopy and other forms of microscopy. |
|
|
World-Wide Web Virtual Library: Microscopy and Technology: Atomic Force Microscopy (AFM) | Crystallography & Diffraction | Confocal Laser Scanning Microscopy (CLSM) | Ion Beams | Nanotechnique |
|
|
2000 Building Publications - Specimen Preparation for Scanning... Specimen Preparation for Scanning Electron Microscopy. Specimen Preparation for Scanning Electron Microscopy. |
|
|
2004 Building Publications - Estimation of the Degree of... Estimation of the Degree of Hydration of Blended Cement Pastes by a Scanning Electron Microscopy Point-Counting Procedure. |
|
|
Google Directory -... Electron Microscopy Science > Methods and Techniques > Microscopy > Electron Microscopy See Google, Inc. Information |
|
|
The Ultrastructure of the Electric Burn in Man: A Transmission... of the Electric Burn in Man: A Transmission Electron Microscopy-Scanning Electron Microscopy Study Torre, C Associate professor and post-graduate See ASTM International Information |
|
|
Cement Clinker Characterization by Scanning Electron... Cement Clinker Characterization by Scanning Electron Microscopy Stutzman, PE Physical scientist, Building and Fire Research Laboratory, Inorganic See ASTM International Information |
|
|
physics@nature.com : Physics articles, jobs and information High-resolution scanning electron microscopy of an ultracold quantum gas See Nature Publishing Group Information |
|
|
IBM Technical Journals spin-polarized scanning electron microscopy, denoted as spin-SEM, or SEMPA. When the beam of a scanning electron microscope traverses a ferromagnetic |
More >>
