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Search GlobalSpec to find electron probe microanalysis-related products, suppliers, datasheets and CAD.
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Products/Services for electron probe microanalysis
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More about CMM Probes
...that transmit light or environmental scanning electron microscopes (SEM). Gemological microscopes use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Tool making specialty... Search by Specification | Learn More about Specialty Microscopes
Ion beam guns and electron beam guns produce beams of electrons, ions or other particles for use in chemical and surface analysis, particle physics, resin curing or semiconductor manufacturing. Learn More about Ion Beam Guns and Electron Beam Guns
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More about Electrical Test Probes
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More about Temperature Probes
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More about Thermistor Temperature Probes
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More about Thermocouple Temperature Probes
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More about Position Probes
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More about IC Pin Probes
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More about Styli and Probes
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More about RTD Temperature Probes
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More about Nondestructive Testing (NDT) Probes
Electron beam welding services use a narrow beam with high energy density to weld metals and alloys with a narrower heat effect zone and deeper penetration compared to most other welding processes. Search by Specification | Learn More about Electron Beam Welding Services
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Sub-micron imaging for metallurgical applications FEI Company
Phenom FEI Company
Phenom use for Pharmaceutical Inspection FEI Company
Desktop electron microscopy: empowering the user FEI Company
Phenom — the First "Point and Shoot" Desktop SEM FEI Company
Introducing the FEI Fibermetric System FEI Company
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Product News for electron probe microanalysis
Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
Probes - Optical Sapphire
Enviroptics Hermetically sealed probes are designed and tested to perform under harsh conditions including high and cryogenic temperatures as well as corrosive and abrasive atmospheres. Operational temperature performance range from +500 C to -70 C. Typical applications are process vision monitoring of ongoing chemical and pharmaceutical processes. (read more)
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
RMP600 machine probe out-of-sight in 3D precision
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes. (read more)
RMP60 Frequency-Hopping Wireless Inspection Probe
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Cable-free twin probe system for machine tools
Cable-free OTS Twin-Probe System from Renishaw performs automated part set-up, measurement, tool setting and broken tool detection. The machine tool system combines a spindle-mounted OMP40-2 inspection probe and OTS tool-setting probe with an optical receiver, enabling fast system integration and cable-free installation on machining centers, especially with twin pallets and rotary tables. (read more)
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Center for Microanalysis of Materials - Materials Research... Center for Microanalysis of Materials About Us |
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Light Microscope Techniques Electron Microscope Techniques Historical and Antique Microscopes Scanning Probe and Atomic Force Energy Dispersive Microanalysis EDX Digital See MicroWorld Resources Information |
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Electron Microscopes, Probe Microscopes, Light Microscopes electron, light, scanning probe, and confocal microscopy See MicroWorld Resources Information |
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Evaluation of Specimen Preparation and the Use of Standards in... The magnitude of systematic and statistical errors in electron probe microanalysis due to faulty specimen preparation is discussed theoretically and See ASTM International Information |
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ASTM International - Symposium on Advances in Electron... Symposium on Advances in Electron Metallography and Electron Probe Microanalysis See ASTM International Information |
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MSFC SD46 Micrscopy and Microanalysis Facility Scanning electron microscopy Electron-probe microanalysis |
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Electron Probe Microanalysis Expert for Consulting, Expert... Electron Probe Microanalysis Experts The following experts are available as electron probe electron probe microanalysis ? microanalysis See Intota Information |
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Geller MicroÅnalytical Laboratory Electron Probe Microanalysis (EPMA) its like the SEM/x-ray but on steroids! See Geller MicroAnalytical Laboratory, Inc. Information |
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BIBLIOGRAPHY Duncumb, P, and S. Reed, in Quantitative Electron Probe Microanalysis, Heinrich, K.F.J., Ed., NBS Special Publication 298 National Bureau of |
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Overview Electron Probe Quantitation library EPQ - Electron Probe Quantitation library EPQ - Electron Probe Quantitation library |
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