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Products/Services for basic measuring instrument
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
Vibration instruments are used for measuring, displaying and analyzing vibration. Typically these instruments comprise a transducer, data acquisition and either a local display or some sort of output to a computer or another instrument. Search by Specification | Learn More about Vibration Instruments
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. Search by Specification | Learn More about Temperature Instruments
Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air. Search by Specification | Learn More about Humidity Measurement Instruments
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More about Electrical Test Probes
Polymer test equipment includes melt flow indexers, extrusiometers, and other specialized instruments for determining the processability and properties of plastics and elastomer materials. Search by Specification | Learn More about Polymer Test Equipment
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Search by Specification | Learn More about Measuring Microscopes
...parameters during thin film or semiconductors wafer processing. Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer... Search by Specification | Learn More about Wafer and Thin Film Instrumentation
...to consider when searching for spectrum analyzers and signal analyzers include mounting and form factor. Choices include handheld, portable or benchtop, and fixed. The analyzer is usually an instrument based unit or pc-based unit. Test types... Search by Specification | Learn More about Spectrum Analyzers and Signal Analyzers
Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn More about Dimensional Gages and Instruments
Instrument transformers are used to step-down current or voltage to measurable values. They provide standardized, useable levels of current or voltage in a variety of power monitoring and measurement applications. Search by Specification | Learn More about Instrument Transformers
Test equipment and instrument repair services test and repair industrial equipment and instruments. They specialize in the test and repair of acoustic and vibration equipment, electrical and electronic test equipment, laboratory equipment Search by Specification | Learn More about Test Equipment and Instrument Repair Services
Coordinate measuring machines (CMMs) are mechanical systems designed to move a measuring probe to determine the coordinates of points on a work piece surface. Search by Specification | Learn More about Coordinate Measuring Machines (CMM)
Density and specific gravity instruments are meters used to determine density and specific gravity. Search by Specification | Learn More about Density and Specific Gravity Instruments
Gas instruments detect, monitor or analyze gases present in an environment. Search by Specification | Learn More about Gas Instruments
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Semiconductor Thickness -- CHRocodile MI5 Precitec, Inc.
Silicon Ingot Inspection System DWFritz Automation, Inc.
Motorized Semiconductor Wafer Shuttle Stage Prior Scientific, Inc.
Automated 3D Wafer Metrology Tool DWFritz Automation, Inc.
Custom Thin Film Equipment Consarc - An Inductotherm Group Company
R&D/Limited Production CMP Tool Lapmaster International
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Product News for basic measuring instrument
LabMaster Bearing Measuring Instrument
The Labmaster Universal bearing measuring instrument can measure a wide range of anti-friction bearings including tapered bearings, needle bearings, ball bearings, spherical bearings, and cylindrical bearings. Measure radial internal clearance (radial play) and axial internal clearance (axial play) with ease using our special fixturing. (read more)
Why Measure Color?
To avoid contamination or gain feedback & identify progress in refining. For consistency in production to ensuring materials sourced meet your standards, and of course final inspection..... all are reasons to monitor color (or is it colour?). Perceptions and interpretations of colour are highly subjective, so the solution is an instrument that explicitly identifies a colour (read more)
Instruments to Measure Color
StellarNet's BLACK-Comet colorimeter is applicable for color measurements of food, beverages, industrial and home liquids, textiles, plastics, pharmaceuticals, and raw materials. (read more)
Laseruler® for Vertical Measuring
Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the part by comparing the measurement probe position to the wavelength of a HeNe laser light source, effectively coupling the wavelength of light to the part being measured. (read more)
Measuring Sprays & Droplets, Measure Droplet Size
The new Malvern Spraytec spray sizing system provides users with in-situ, real-time measurements of the droplet size distributions produced by spray and aerosol devices. Using the technique of laser diffraction, it has been specifically designed to address the unique requirements of spray characterization, yielding robust... (read more)
New Multi Axis Load Cell measures Tri-Axial Loads
FUTEK Advanced Sensor Technology, Inc. (www.futek.com) has just expanded its Multi Axis Load Cell series with the new MTA505 Multi Axis Load Cell. The MTA505 Multi Axis Load Cell (Tri-Axial) offers an excellent solution for measuring Mx, My, and Fz loads. It is currently offered in two capacity options: (read more)
Unique Optical Receiver Measures OMI
The FOS 1000A offers engineers the most affordable tool on the market for optimizing laser transmitters. By monitoring/measuring Optical Modulation Index, this unit provides a unique capability that saves a tremendous amount of money and time versus other alternatives. (read more)
Handheld Meter Designed to Measure Ion Density
At $390 USD, it is the lowest-priced true ion density meter available. (read more)
Measure Cell Density-almost anywhere!
The Biochrom WPA CO 8000 is a simple, reliable instrument that measures the density of cells grown in suspension by measuring OD at 600nm. It is ideal for cells grown in suspension such as yeast and bacterial cultures. (read more)
SOLA II (Sulfur OnLine Analysis) Instrument
The SOLA II (Sulfur OnLine Analysis) instrument measures total sulfur in liquid hydrocarbon fuel process streams. The SOLA addresses the need for a low maintenance sulfur analyzer that can reliably measure low ppm levels. (read more)
Conduct Research
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Geometric Considerations of Surface Profilers and Pivoting Step Measurers (AN518)
In recent years, stylus-based surface measuring instruments have broadened in application to become among the most widely used general purpose instruments in advanced R&D and manufacturing. These...(read more)
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INSTRUMENTS FOR INDUSTRY: Measuring High Power RF Pulse Field Levels (.pdf)
The DO-160 Standard requires two basic types of pulse modulations, SW or Square Wave Modulation and PM or Pulse Modulation. The purpose and function of this application note will be to describe and...(read more)
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Maximizing Eb/No (C/N) Accuracy (Application Note 701)
The CNG series of generators have the ability to make highly accurate Eb/N0 or C/N ratios when used correctly. The basic operation of the CNG is depicted by the RF test block diagram in Figure 1,...(read more)
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Probes and Probing
The following section gives an overview of the basic characteristics of each of the major oscilloscopes probe types. In addition, a number of examples demonstrate how probe misuse can dramatically...(read more)
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Time Domain for Vector Network Analyzers
Vector Network Analyzers (VNAs) are very flexible measuring instruments-the microwave engineer's most powerful tool. Their basic capability is to measure the S-parameters of an RF or microwave device...(read more)
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Implementing a PID Controller Using a PIC18 MCU
Continuous processes have been controlled by feedback loops since the late 1700's. In 1788, James Watt used a flyball governor on his steam engine to regulate its speed. The Taylor Instrument Company...(read more)
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Design, Calibration and Performance of Microtops II Hand-Held Ozonometer.
The intensity of ultraviolet radiation at the surface of the Earth is modulated by aerosols and ozone within the atmosphere. Since ozone absorbs shorter wavelengths more effectively than longer...(read more)
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Surface Texture Parameters
Every part's surface is made up of texture and roughness which varies due to manufacturing techniques and the part structure itself. To understand a component's surface and to control the...(read more)
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High Accuracy Temperature Measurement
There are many different approaches and techniques for measuring temperature, but one of the most fundamental issues involves understanding the application at hand. A basic evaluation of the...(read more)
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Explanation of the Principles Used in Single Point Acoustic Current Meters
The RCM 9 and RCM 11 are acoustic Doppler backscatter-based current meters. Its basic way of operation is to emit an acoustic pulse and measure the frequency shift of any incoming reflection. These...(read more)
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Wilkinson Microwave Microwave Anisotropy Probe By measuring the polarization in the CMB it is possible to look at the amplitude of the fluctuations of density in the universe that produced the |
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NASA Space Instrument and Sensing Technology Instrument and Sensing Technology On this page: Instrument and Sensing Technology Overview |
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EMMA: a free Java code coverage tool Code coverage for free: a basic freedom? EMMA is an open-source toolkit for measuring and reporting Java code coverage. |
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Calibration - Wikipedia, the free encyclopedia the relationship between the values of quantities indicated by a measuring instrument and the corresponding values realized by standards. |
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Oscilloscope - Wikipedia, the free encyclopedia A Tektronix model 475A portable analog oscilloscope, a very typical instrument of the late 1970s |
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MATLAB Central - Files example, application, basic commu..., instrument See MathWorks, Inc. (The) Information |
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Scantek, Inc. is a worldwide leader in sound and vibration... HUMAN BODY VIBRATION: A SELF-CONTAINED HAND and ARM VIBRATION MEASURING AND ANALYSIS SYSTEM 03/20/09 See Scantek, Inc. Information |
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INDUSTRIAL MEASUREMENTS AND CONTROL (Basic Concepts and Current Devices) Wednesday Nights 6:00 to 9:00 PM See International Society of Automation Information |
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accuracy - Developer Zone - National Instruments value which is often significantly "worse" than the basic "sine wave" accuracy of the instrument. |
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Agilent Technologies / Hewlett-Packard hp8902a - IEEE 488.2... NI Home NI Developer Zone Instrument Driver Network Multi-Environment Plug and Play Instrument Driver |
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