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The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More) |
Products/Services for Auger Electron Spectroscopy, AES
...it is bombarded with a stream of ions or charged particles. Electron auger spectroscopy is also used to analyze surface composition of materials. Auger electron spectroscopy (AES) measures the energies of Auger electrons, which are created by bombarding the sample... Learn More about Specialty Spectrometers and Accessories
...use sieving, dynamic light scattering, electrozone sensing, laser diffraction, low angle light scattering (LALLS), microscopy, or sedimentation. Companies that perform X-ray radiography, scanning acoustic microscopy (SAM), auger spectroscopy (AES... Search by Specification | Learn More about Analytical Laboratory Services
...emission spectroscopy and ionizes atoms for mass spectrometry. Infrared (IR) spectroscopy measures the wavelength and absorption intensity of infrared light. Microscopy uses instruments such as optical and electron microscopes to study the structure... Search by Specification | Learn More about Chemical Testing Services
IR) spectroscopy measures the wavelength and absorption intensity of infrared light. Microscopy uses instruments such as optical and electron microscopes to study the structure and composition of materials. Non-destructive testing (NDT) examines... Search by Specification | Learn More about Material Testing Services
Environmental testing and analytical services provide testing of environmental samples such as soil, water, air, and industrial wastes or byproducts. Search by Specification | Learn More about Environmental Testing and Analysis Services
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system Search by Specification | Learn More about Semiconductor Metrology Instruments
Augers are large diameter, drill-like devices that are used for drilling holes into the earth, stone and pavement as well as moving grain and water in certain applications. Learn More about Augers
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers
Ion beam guns and electron beam guns produce beams of electrons, ions or other particles for use in chemical and surface analysis, particle physics, resin curing or semiconductor manufacturing. Learn More about Ion Beam Guns and Electron Beam Guns
...be detected simultaneously using a polychromator with multiple detectors. This ability to simultaneously measure multiple elements is a major advantage of AES compared to atomic-absorption (AA) spectroscopy. Atomic emission and optical emission... Search by Specification | Learn More about Atomic Emission and Optical Emission Spectrometers
Electron beam welding services use a narrow beam with high energy density to weld metals and alloys with a narrower heat effect zone and deeper penetration compared to most other welding processes. Search by Specification | Learn More about Electron Beam Welding Services
...emit light that is separated into individual lines via a photodiode array. Electron capture gas chromatography detectors use a radioactive Beta emitter (electrons) to ionize some of the carrier gas and produce a current between a biased pair... Search by Specification | Learn More about GC Detectors
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
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New Varian 670/680-IR FT-IR spectrometer Varian, Inc.
Avantes Multi-Layer Thin Film Solution Avantes
Cosine Corrector/AvaSolar Solar Measurement Avantes
Blend Ratio Measurements of Biofuels Wilks Enterprise, Inc.
EX-6600 - Advanced Laboratory Spectrometer Xenemetrix Inc. (Formerly Jordan Valley AR Inc.)
RoHS MicroAnalyzer Xenemetrix Inc. (Formerly Jordan Valley AR Inc.)
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Product News for Auger Electron Spectroscopy, AES
NIR Spectroscopy for Process Control
Near Infrared (NIR) spectroscopy is used for fast, reliable, and non-destructive measurements that simultaneously control manufacturing processes and product quality, assuring that final product specifications and quality are met. (read more)
Infrared Spectroscopy System - Raman microscopes
Infrared spectroscopy can now be combined with Renishaw Raman microscopes to offer confocal Raman microscopy and infrared microscopy in a single instrument. This provides users with exceptional analytical power for identifying unknown materials by combining both vibrational spectroscopic techniques. This combined IR/Raman analysis simplifies a wide range of analytical... (read more)
U-Trough & Tube-Type Solid Core Augers
Any material handling system depends on its ability to convey materials from storage areas to work areas throughout your operation, automatically, economically & reliably. Whether conveying dry bulk materials into overhead storage bins or moving it from mixing & storage areas to processing points throughout the plant, NBE offers the components required to do the job quickly, quietly & dust free. (read more)
New “Concentric-Auger” Pump for Sludge Cake
seepex has developed a new type of open hopper pump to transport extremely viscous products and dewatered sludge cake. (read more)
Automation Machinery From AES
Accu-Set™ is an expertise from AES for highly automating machines capable of using heat to form or bond rubber materials (read more)
AES Offers Accu-Pin™ Automatic Pin-Insertion
Accu-Pin™ Patent Pending Technology Holds ±1mm Hole-to-Hole Tolerance.
- Accu-Pin™ Patent Pending Technology Holds ±1mm Hole-to-Hole Tolerance
- Laser Length Gauging For Automatic Length Compensation
- Industry Leading 3 Axis Servo Pin Insertion
- Industry Leading Speed And Accuracy
Induction Heat Treating Machines from AES
An induction heat treating machine which provided its customer with the ability to heat-treat specific areas of a continuous piece of material - such as crankshafts or camshafts. It contained a servo controlled indexing slide with CNC based controls to make it capable of handling a "family of parts" (read more)
Automated Packaging Equipment From AES
Advanced Engineered Systems will be able to assist you with your packaging needs. We can provide equipment to do the following: (read more)
Enhanced Laser Diode Spectroscopy™ (ELDS)
The technology developed by Senscient to meet the demands of industrial safety, environmental monitoring and process control / analysis applications is "Enhanced Laser Diode Spectroscopy," a truly revolutionary gas detection and measurement technology. Learn more from this technical article. (read more)
Fiberoptic Spectroscopy Solutions from Avantes
Wilkens-Anderson is a proud distributor of the entire line of Avantes products. Avantes focuses on finding solutions to meet the measurement needs of customers. In order to help customers in such a broad range of industries Avantes developed targeted solutions for common applications: (read more)
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Role of Surface Composition on the Corrosion Resistance of Electropolished 316L Stainless Steel (.pdf)
In the semiconductor fabrication industry, surface analytic tools are often employed to quantify the oxide layer of AISI 316L components used for high purity gas distribution. Specifically, Auger...(read more)
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ASTM E995 -04 Standard Guide for Background Subtraction... ASTM E995 - 04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy See ASTM International Information |
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ASTM E983 -05 Standard Guide for Minimizing Unwanted Electron... ASTM E983 - 05 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy See ASTM International Information |
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SRD Auger XPS Objective: To provide needed reference data for surface analyses by Auger-electron spectroscopy (AES) and X-Ray photoelectron spectroscopy (XPS). |
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XPSstdData to be made with improved accuracy by Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) for nanotechnology, semiconductor |
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MICROLAB 350 - Auger Electron Spectrometer-Thermo Scientific Product Browse Products >>... >> Surface Analysis >> Auger Electron Spectroscopy (AES) |
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Thermo Scientific - Auger Electron Spectroscopy (AES) Auger Electron Spectroscopy (AES) A brief introduction to the technique of Auger Electron Spectroscopy (AES) |
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Auger electron spectroscopy: Definition from Answers.com Auger electron spectroscopy Sci-Tech Dictionary: Auger electron spectroscopy |
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AUGER ELECTRON SPECTROSCOPY - Storming Media Reports by Keyword(s) AUGER ELECTRON SPECTROSCOPY See Storming Media LLC Information |
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Angle Resolved Auger Electron Spectroscopy: An Alternate Tool... Angle Resolved Auger Electron Spectroscopy: An Alternate Tool for Identifying Electronic Excitation Processes in Solids See Storming Media LLC Information |
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AES Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving its name from the effect first observed by Pierre See Johns Hopkins University Whiting School of Engineering (The) Information |
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