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Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Specialty microscopes are designed for specific applications such as metallurgy or gemology. They use specialized techniques or technologies such as acoustics to produce magnification. Search by Specification | Learn More about Specialty Microscopes
Microscopes are instruments that produce magnified images of small objects Search by Specification | Learn More about Microscopes
Metallurgical microscopes are used for metallurgical inspection including metals, ceramics, and other materials. Search by Specification | Learn More about Metallurgical Microscopes
Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Search by Specification | Learn More about Measuring Microscopes
Biological microscopes are used to study organisms and their vital processes. Search by Specification | Learn More about Biological Microscopes
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution. Search by Specification | Learn More about Digital and Video Microscopes
Microscope accessories and microscope supplies are used with many different types of microscopes, including dissection or stereoscopic, compound, and confocal devices. Learn More about Microscope Accessories and Supplies
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More about Electron Microscopes
Optical and light microscopes use the visible or near-visible portion of the electromagnetic spectrum to magnify images of objects. Search by Specification | Learn More about Optical and Light Microscopes
Microscope stages are platforms where specimens are placed for observation with a microscope. They are often equipped with a mechanical device which holds the specimen slide in place, but allows the back-and-forth and side-to-side movement of the slide. Search by Specification | Learn More about Microscope Stages
Microscope lenses and microscope objectives include eyepieces or oculars, optical filters, objectives, adapters or mounts, condensers and other optical components for microscopy. Learn More about Microscope Lenses and Objectives
...force microscope (AFM), a high-powered instrument able to image surfaces to molecular accuracy by mechanically probing their surface contours. A coordinate measuring machine (CMM) is designed to move probes that locate point coordinates on three... Learn More about Styli and Probes
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More about Imaging Workstations
...light or electron microscopes. Microscopy and metallography sample preparation equipment includes sectioning saws and wire saws to prepare clean, smooth surfaces for viewing and analysis. A sectioning saw is designed to cut many types of materials... Learn More about Microscopy and Metallography Sample Preparation Equipment
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
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Dimension® Icon™ Atomic Force Microscope Veeco Instruments
BioScope™ Catalyst™ Atomic Force Microscope Veeco Instruments
Innova AFM Veeco Instruments
Insight 3D Atomic Force Microscope Veeco Instruments
MX-BGAZ II Hirox-USA, Inc.
STM6® Series Measuring Microscopes Olympus America Inc.
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You'll be amazed by the high-resolution, low-noise images from our new Innova AFM. (read more)
The best research instruments not only acquire the intended data, but actually increase productivity. Veeco's new BioScope™ Catalyst™ Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy. (read more)
The Dimension® Icon™ Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in polymers, semiconductors, energy, data storage and other materials fields. The latest member of the Dimension family is the culmination of decades of technological innovation, industry-leading application customization, and customer feedback. (read more)
Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)
The InSightTM 3D Atomic Force Microscope (AFM) provides unparalleled accuracy and precision required for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features. (read more)
Microscopes and lenses for laboratories and inspection work, and high quality magnification (read more)
PicoCube™ XY and XYZ piezo stage scanning systems are ultra-high-performance, closed-loop piezoelectric scanning systems. Designed for AFM, SPM and nanomanipulation applications, they combine an extremely low-inertia (10 kHz resonant frequency!), high-speed piezo scanner with non-contact, direct-measuring, parallel-metrology capacitive feedback capable of 25 picometers resolution. (read more)
Model AFM Mass Flow Meters are designed to indicate flow rates of gases. Each of these units incorporates an advanced straight tube sensor in conjunction with flow passage elements constructed of stainless steel. LED readouts of command modules are supplied with 0 to 100 percent calibrations.
For service in Europe visit www.aalborginstruments.de (read more)
The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller. (read more)
The inverted microscopes is a very popular platform for automation due to their stability and optical performance. Inverted microscopes typically permit the least amount of freedom for stage design. (read more)
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Asylum Research - Atomic Force Microscopes MFP-3D-BIO Uncompromised AFM performance on an inverted optical microscope platform. The World?s Highest Resolution AFM Decode the Nanoworld See Asylum Research Information |
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Veeco - Solutions for a Nanoscale World Automated AFM / AFP Systems Applications See Veeco Instruments Profile & Catalog |
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How to Grab an Atom | Physical Review Focus A similar device called an atomic force microscope (AFM) images a surface by measuring mechanical forces on the tip, so it works for nonconducting |
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Microscopy - Wikipedia, the free encyclopedia Scanning electron microscope image of pollen. |
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Scanning probe microscopy - Wikipedia, the free encyclopedia (Redirected from Scanning probe microscope) Scanning probe microscopy Atomic force microscope Scanning tunneling microscope |
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Design of an Atomic Force Microscope using NI ELVIS and... The Challenge: Designing a cost-effective atomic force microscope (AFM) for nanotechnology research using commercially available parts and a widely |
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Atomic Force Microscope (AFM) | CSM Instruments Atomic Force Microscope (AFM) Atomic Force Microscope, or Scanning Probe Microscopy (AFM, SPM), is an See CSM Instruments Information |
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Agilent | United States Home Agilent Technologies Expands Capabilities of Highly Versatile Atomic Force Microscope [2009-03-09 See Agilent Technologies, Inc. / Electronic Measurement Group Information |
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PROBING BIOMOLECULES WITH THE ATOMIC FORCE MICROSCOPE PROBING BIOMOLECULES WITH THE ATOMIC FORCE MICROSCOPE. Helen G. Hansma, Department of Physics, University of California, Santa Barbara, CA 931106 |
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2001 Building Publications - Direct Measurement of Plowing... Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope. |